On Supporting Sequential Constraints for On-Chip Generation of Post-Silicon Validation Stimuli

被引：3
|
作者：
Shi, Xiaobing [1 ]
Nicolici, Nicola [1 ]
机构：
[1] McMaster Univ, Dept Elect & Comp Engn, Hamilton, ON, Canada
来源：
2014 IEEE 23RD ASIAN TEST SYMPOSIUM (ATS) | 2014年
关键词：
D O I：
10.1109/ATS.2014.30
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Post-silicon validation plays a critical role in exposing design errors in early silicon prototypes. Its effectiveness is conditioned by in-system application of functionally-compliant stimuli for extensive periods of time. This is achieved by expanding on-the-fly randomized functional sequences, which are subjected to user-programmable constraints. In this paper we present a method to extend the existing work for on-chip generation of functionally-compliant randomized sequences with support for sequential constraints.
引用
收藏
页码：107 / 112
页数：6
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