Quantitative estimation of efficiency of wavelet-processing images for single crystal structure defects

被引：0

作者：

Tkal, V. A. ^{[1
]}

Petrov, M. N. ^{[1
]}

机构：

[1] Novgorod State Univ, Veliky Novgorod, Novgorod Oblast, Russia

来源：

JOURNAL OF SURFACE INVESTIGATION-X-RAY SYNCHROTRON AND NEUTRON TECHNIQUES | 2011年 / 5卷 / 03期

关键词：

Discrete Wavelet Transform; Surface Investigation; Neutron Technique; Noise Factor; Digital Processing;

D O I：

10.1134/S102745101105017X

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

A simple procedure for quantitative estimation of the quality and efficiency of digital processing based on discrete wavelet transform (DWT) of X-ray topographic and polarization-optical images for single crystal structure defects is proposed. Digital processing of theoretical and experimental images of defects in a 6H-SiC single crystal has been performed using different wavelet types. It is shown that the brightness characteristics of the analyzed image and differential contrast may be used as a quantitative criterion of the processing quality and efficiency for the chosen wavelet. Theoretical images of typical defects in a single crystal structure calculated by the modified Indenbom-Chamrov equations have been used as a reference object.

引用

页码：419 / 425

页数：7

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