Quantitative estimation of efficiency of wavelet-processing images for single crystal structure defects

被引：0
|
作者：
Tkal, V. A. [1 ]
Petrov, M. N. [1 ]
机构：
[1] Novgorod State Univ, Veliky Novgorod, Novgorod Oblast, Russia
来源：
JOURNAL OF SURFACE INVESTIGATION-X-RAY SYNCHROTRON AND NEUTRON TECHNIQUES | 2011年 / 5卷 / 03期
关键词：
Discrete Wavelet Transform; Surface Investigation; Neutron Technique; Noise Factor; Digital Processing;
D O I：
10.1134/S102745101105017X
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
A simple procedure for quantitative estimation of the quality and efficiency of digital processing based on discrete wavelet transform (DWT) of X-ray topographic and polarization-optical images for single crystal structure defects is proposed. Digital processing of theoretical and experimental images of defects in a 6H-SiC single crystal has been performed using different wavelet types. It is shown that the brightness characteristics of the analyzed image and differential contrast may be used as a quantitative criterion of the processing quality and efficiency for the chosen wavelet. Theoretical images of typical defects in a single crystal structure calculated by the modified Indenbom-Chamrov equations have been used as a reference object.
引用
收藏
页码：419 / 425
页数：7
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