Quantitative estimation of efficiency of wavelet-processing images for single crystal structure defects

被引：0

作者：

Tkal, V. A. ^{[1
]}

Petrov, M. N. ^{[1
]}

机构：

[1] Novgorod State Univ, Veliky Novgorod, Novgorod Oblast, Russia

来源：

JOURNAL OF SURFACE INVESTIGATION-X-RAY SYNCHROTRON AND NEUTRON TECHNIQUES | 2011年 / 5卷 / 03期

关键词：

Discrete Wavelet Transform; Surface Investigation; Neutron Technique; Noise Factor; Digital Processing;

D O I：

10.1134/S102745101105017X

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

A simple procedure for quantitative estimation of the quality and efficiency of digital processing based on discrete wavelet transform (DWT) of X-ray topographic and polarization-optical images for single crystal structure defects is proposed. Digital processing of theoretical and experimental images of defects in a 6H-SiC single crystal has been performed using different wavelet types. It is shown that the brightness characteristics of the analyzed image and differential contrast may be used as a quantitative criterion of the processing quality and efficiency for the chosen wavelet. Theoretical images of typical defects in a single crystal structure calculated by the modified Indenbom-Chamrov equations have been used as a reference object.

引用

页码：419 / 425

页数：7

共 50 条

[31] High-efficiency coupling structure for a single-line-defect photonic-crystal waveguide
Prather, DW
Murakowski, J
Shi, SY
Venkataraman, S
Sharkawy, A
Chen, CH
Pustai, D
OPTICS LETTERS, 2002, 27 (18) : 1601 - 1603
[32] Single crystal structure and electroluminescence efficiency of blue fluorescence OLED emitters using triple core chromophores
Jung, Hyocheol
Kang, Seokwoo
Sim, Yeonhee
Jung, Mina
Wakamiya, Atsushi
Lee, Ji-Hoon
Park, Jongwook
ORGANIC ELECTRONICS, 2019, 73 : 261 - 265
[33] QUANTITATIVE-ANALYSIS OF CRYSTAL-STRUCTURE BY STEREOPHOTOGRAMMETRIC TREATMENT OF THE DEFOCUSED DARK-FIELD ELECTRONIC IMAGES OF CRYSTALS
SPASSKII, MN
METTUS, AO
INDUSTRIAL LABORATORY, 1978, 44 (11): : 1535 - 1540
[34] A quantitative metallographic assessment of the evolution of porosity during processing and creep in single crystal Ni-base super alloys
Buck, H.
Wollgramm, P.
Parsa, A. B.
Eggeler, G.
MATERIALWISSENSCHAFT UND WERKSTOFFTECHNIK, 2015, 46 (06) : 577 - 590
[35] Energy-loss mechanism of single-crystal silicon microcantilever due to surface defects generated during plasma processing
Wada, Akira
Yanagisawa, Yuuki
Altansukh, Batnasan
Kubota, Tomohiro
Ono, Takahito
Yamasaki, Satoshi
Samukawa, Seiji
JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 2013, 23 (06)
[36] Development of a CNN-based hierarchical inspection system for detecting defects on electroluminescence images of single-crystal silicon photovoltaic modules
Lin, Keh-Moh
Lin, Horng-Horng
Lin, You-Teh
MATERIALS TODAY COMMUNICATIONS, 2022, 31
[37] Exploiting Symmetry and/or Manhattan Properties for 3D Object Structure Estimation from Single and Multiple Images
Gao, Yuan
Yuille, Alan L.
30TH IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR 2017), 2017, : 6718 - 6727
[38] On single-crystal neutron-diffraction in DACs: quantitative structure refinement of light elements on SNAP and TOPAZ
Massani, B.
Loveday, J. S.
Molaison, J. J.
dos Santos, A. M.
Wang, X. P.
Daemen, L. L.
Haberl, B.
Boehler, R.
Guthrie, M.
HIGH PRESSURE RESEARCH, 2020, 40 (03) : 339 - 357
[39] Quantitative Study of Domain Structure of BaTiO3 Single Crystal by UHV-Sanning Probe Microscopy
Kaku, S.
Eto, H.
Nakamura, K.
Watanabe, Y.
ISAF: 2009 18TH IEEE INTERNATIONAL SYMPOSIUM ON THE APPLICATIONS OF FERROELECTRICS, 2009, : 29 - 32
[40] Elimination of background heterogeneity and influence of granularity of photographic materials on topographical and polarization-optical images of single crystals structure defects
Drozdov, Yu.A.
Tkal', V.A.
Okunev, A.O.
Danil'chuk, L.N.
Zavodskaya Laboratoriya. Diagnostika Materialov, 2004, 70 (07): : 25 - 34

← 1 2 3 4 5 →