A high-speed full swing CMOS driver for TFT-LCD scan-line circuit

被引：0
|
作者：
Lai, H. C. [1 ]
Lin, Z. M. [1 ]
机构：
[1] Natl Changhua Univ Educ, Grad Inst Integrated Circuit Design, Changhua, Taiwan
来源：
TENCON 2007 - 2007 IEEE REGION 10 CONFERENCE, VOLS 1-3 | 2007年
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
In this paper, a high-speed full swing CMOS driver for TFT-LCD scan-line circuit is presented. High driving capability is achieved by a proposed Complementary Dual-Bootstrap (CDUB) technique. The scan-line CDUB driver was fabricated in a 0.35 mu m CMOS technology. The measured results, under the TFT-LCD scan-tine load model, indicate that the delay time is within 2.8 mu s and the average power is 0.74 mW for a 5 V supply voltage.
引用
收藏
页码：531 / 533
页数：3
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