A high-speed full swing CMOS driver for TFT-LCD scan-line circuit

被引：0

作者：

Lai, H. C. ^{[1
]}

Lin, Z. M. ^{[1
]}

机构：

[1] Natl Changhua Univ Educ, Grad Inst Integrated Circuit Design, Changhua, Taiwan

来源：

TENCON 2007 - 2007 IEEE REGION 10 CONFERENCE, VOLS 1-3 | 2007年

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

In this paper, a high-speed full swing CMOS driver for TFT-LCD scan-line circuit is presented. High driving capability is achieved by a proposed Complementary Dual-Bootstrap (CDUB) technique. The scan-line CDUB driver was fabricated in a 0.35 mu m CMOS technology. The measured results, under the TFT-LCD scan-tine load model, indicate that the delay time is within 2.8 mu s and the average power is 0.74 mW for a 5 V supply voltage.

引用

页码：531 / 533

页数：3

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