Optimizing the performance of ESD circuit protection devices

被引：1

作者：

Hyatt, H ^{[1
]}

Harris, J ^{[1
]}

Colby, J ^{[1
]}

Bellew, P ^{[1
]}

机构：

[1] Littelfuse Inc, Des Plaines, IL 60061 USA

来源：

ELECTRICAL OVERSTRESS/ELECTROSTATIC DISCHARGE SYMPOSIUM PROCEEDINGS, 2000 | 2000年

关键词：

D O I：

10.1109/EOSESD.2000.890025

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Decision-making methods for choosing ESD circuit protection remain poorly understood. Selecting an IC, which passed ESD device level testing, does not guarantee a particular circuit using that device will survive ESD events. We present an optimizing methodology for assessing ESD circuit protection.

引用

页码：41 / 47

页数：5

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