Optimizing the performance of ESD circuit protection devices

被引：1
|
作者：
Hyatt, H [1 ]
Harris, J [1 ]
Colby, J [1 ]
Bellew, P [1 ]
机构：
[1] Littelfuse Inc, Des Plaines, IL 60061 USA
来源：
ELECTRICAL OVERSTRESS/ELECTROSTATIC DISCHARGE SYMPOSIUM PROCEEDINGS, 2000 | 2000年
关键词：
D O I：
10.1109/EOSESD.2000.890025
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Decision-making methods for choosing ESD circuit protection remain poorly understood. Selecting an IC, which passed ESD device level testing, does not guarantee a particular circuit using that device will survive ESD events. We present an optimizing methodology for assessing ESD circuit protection.
引用
收藏
页码：41 / 47
页数：5
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