Structural evolution of GaN layers grown on (0 0 0 1) sapphire by hydride vapor phase epitaxy

被引:5
|
作者
Meng, F. Y. [1 ]
Han, I. [1 ]
McFelea, H. [1 ]
Lindow, E. [2 ]
Bertram, R. [2 ]
Werkhoven, C. [2 ]
Arena, C. [2 ]
Mahajan, S. [3 ]
机构
[1] Arizona State Univ, Sch Engn Matter Transport & Energy, Tempe, AZ 85287 USA
[2] GaNotec Inc, Tempe, AZ 85284 USA
[3] Univ Calif Davis, Dept Chem Engn & Mat Sci, Davis, CA 95616 USA
关键词
Hydride vapor phase epitaxy; Gallium nitride; Transmission electron microscopy; Characterization; HIGH-QUALITY GAN; THREADING DISLOCATIONS; NUCLEATION LAYERS; HVPE; DEPOSITION; TEMPERATURE; TEMPLATES; STRAIN;
D O I
10.1016/j.jcrysgro.2011.05.020
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
GaN was grown directly on (0 0 0 1) sapphire by a two-step process using hydride vapor phase epitaxy (HVPE). Nucleation layers deposited on sapphire at similar to 450-500 degrees C consisted of localized epitaxial wurtzite GaN nano-crystals. In between and above the epitaxial nano-crystals were randomly oriented wurtzite GaN nano-crystals. GaN islands of various sizes and shapes were formed, after annealing between similar to 900 and 1000 degrees C, through a decomposition-redeposition process. Preferential growth of GaN occurred on the islands that had an epitaxial relationship with sapphire during the subsequent high-temperature overgrowth. Threading dislocations were observed in isolated GaN islands that were formed after annealing. Published by Elsevier B.V.
引用
收藏
页码:13 / 21
页数:9
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