Structural evolution of GaN layers grown on (0 0 0 1) sapphire by hydride vapor phase epitaxy

被引:5
|
作者
Meng, F. Y. [1 ]
Han, I. [1 ]
McFelea, H. [1 ]
Lindow, E. [2 ]
Bertram, R. [2 ]
Werkhoven, C. [2 ]
Arena, C. [2 ]
Mahajan, S. [3 ]
机构
[1] Arizona State Univ, Sch Engn Matter Transport & Energy, Tempe, AZ 85287 USA
[2] GaNotec Inc, Tempe, AZ 85284 USA
[3] Univ Calif Davis, Dept Chem Engn & Mat Sci, Davis, CA 95616 USA
关键词
Hydride vapor phase epitaxy; Gallium nitride; Transmission electron microscopy; Characterization; HIGH-QUALITY GAN; THREADING DISLOCATIONS; NUCLEATION LAYERS; HVPE; DEPOSITION; TEMPERATURE; TEMPLATES; STRAIN;
D O I
10.1016/j.jcrysgro.2011.05.020
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
GaN was grown directly on (0 0 0 1) sapphire by a two-step process using hydride vapor phase epitaxy (HVPE). Nucleation layers deposited on sapphire at similar to 450-500 degrees C consisted of localized epitaxial wurtzite GaN nano-crystals. In between and above the epitaxial nano-crystals were randomly oriented wurtzite GaN nano-crystals. GaN islands of various sizes and shapes were formed, after annealing between similar to 900 and 1000 degrees C, through a decomposition-redeposition process. Preferential growth of GaN occurred on the islands that had an epitaxial relationship with sapphire during the subsequent high-temperature overgrowth. Threading dislocations were observed in isolated GaN islands that were formed after annealing. Published by Elsevier B.V.
引用
下载
收藏
页码:13 / 21
页数:9
相关论文
共 50 条
  • [11] Effect of sapphire substrate orientation on the surface morphology and structural quality of thick GaN layers grown by hydride vapor phase epitaxy
    A. A. Donskov
    L. I. Dyakonov
    Yu. P. Kozlova
    S. S. Malakhov
    M. V. Mezhennyi
    V. F. Pavlov
    T. G. Yugova
    Crystallography Reports, 2011, 56
  • [12] Effect of sapphire substrate orientation on the surface morphology and structural quality of thick GaN layers grown by hydride vapor phase epitaxy
    Donskov, A. A.
    Dyakonov, L. I.
    Kozlova, Yu. P.
    Malakhov, S. S.
    Mezhennyi, M. V.
    Pavlov, V. F.
    Yugova, T. G.
    CRYSTALLOGRAPHY REPORTS, 2011, 56 (02) : 274 - 281
  • [13] Photoluminescence studies of GaN layers grown by hydride vapor phase epitaxy
    Yu, PW
    Park, CS
    Kim, ST
    JOURNAL OF APPLIED PHYSICS, 2001, 89 (03) : 1692 - 1695
  • [14] Hydride vapor phase epitaxy growth of GaN on sapphire with ZnO buffer layers
    S. Gu
    R. Zhang
    Y. Shi
    Y. Zheng
    L. Zhang
    T.F. Kuech
    Applied Physics A, 2002, 74 : 537 - 540
  • [15] Hydride vapor phase epitaxy growth of GaN on sapphire with ZnO buffer layers
    Gu, S
    Zhang, R
    Shi, Y
    Zheng, Y
    Zhang, L
    Kuech, TF
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2002, 74 (04): : 537 - 540
  • [16] Characterization of ALN buffer layers on (0 0 0 1)-sapphire substrates
    Universite de Montpellier II, Montpellier, France
    J Cryst Growth, (282-286):
  • [17] Evolution of deep centers in GaN grown by hydride vapor phase epitaxy
    Fang, ZQ
    Look, DC
    Jasinski, J
    Benamara, M
    Liliental-Weber, Z
    Molnar, RJ
    APPLIED PHYSICS LETTERS, 2001, 78 (03) : 332 - 334
  • [18] Optical and structural studies of hydride vapor phase epitaxy grown GaN
    Chang, YC
    Cai, AL
    Muth, JF
    Kolbas, RM
    Park, M
    Cuomo, JJ
    Hanser, A
    Bumgarner, J
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2003, 21 (03): : 701 - 705
  • [20] Electronic and structural properties of GaN grown by hydride vapor phase epitaxy
    Gotz, W
    Romano, LT
    Krusor, BS
    Johnson, NW
    Molnar, RJ
    APPLIED PHYSICS LETTERS, 1996, 69 (02) : 242 - 244