Characterization of SiC using synchrotron white beam X-ray topography

被引：34

作者：

Dudley, M ^{[1
]}

Huang, XR ^{[1
]}

机构：

[1] SUNY Stony Brook, Dept Mat Sci & Engn, Stony Brook, NY 11794 USA

来源：

SILICON CARBIDE AND RELATED MATERIALS - 1999 PTS, 1 & 2 | 2000年 / 338-3卷

关键词：

defects; micropipe; screw dislocation; synchrotron topography;

D O I：

10.4028/www.scientific.net/MSF.338-342.431

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A short review of recent synchrotron white beam X-ray topography (SWBXT) studies of defects in 4H and 6H SiC is presented. Defects observed include closed-core and hollow-core screw dislocations (micropipes) in 6H and 4H, deformation induced basal plane dislocations in 6H and 4H, and small angle boundaries in 4H. These studies include the analysis of the relationship between hollow-core diameter and the Burgers vector for micropipes using SWBXT and scanning electron microscopy (SEM), the principles of a set of SWBXT techniques and associated simulations for characterizing micropipes and closed-core screw dislocations, and the nucleation mechanism of micropipes obtained using SWBXT in combination with other techniques.

引用

页码：431 / 436

页数：6

共 50 条

[31] CRYOGENIC X-RAY TOPOGRAPHY USING SYNCHROTRON RADIATION
TANNER, BK
SAFA, M
MIDGLEY, D
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1977, 10 (APR1) : 91 - 99
[32] X-RAY TOPOGRAPHY USING SYNCHROTRON-RADIATION
WIETESKA, K
[J]. ACTA PHYSICA POLONICA A, 1994, 86 (04) : 545 - 552
[33] Synchrotron white beam x-ray topography characterization of defect structures in 2,10-undecanedione/urea inclusion compounds
Chung, H
Dudley, M
Brown, ME
Hollingsworth, MD
[J]. MOLECULAR CRYSTALS AND LIQUID CRYSTALS SCIENCE AND TECHNOLOGY SECTION A-MOLECULAR CRYSTALS AND LIQUID CRYSTALS, 1996, 276 : 203 - 212
[34] Characterization of dislocations in monoclinic hen egg-white lysozyme crystals by synchrotron monochromatic-beam X-ray topography
Sawaura, Takuya
Fujii, Daiki
Shen, Mengyuan
Yamamoto, Yu
Wako, Kei
Kojima, Kenichi
Tachibana, Masaru
[J]. JOURNAL OF CRYSTAL GROWTH, 2011, 318 (01) : 1071 - 1074
[35] INSITU DETERMINATION OF GRAIN-BOUNDARY MIGRATION RATES BY SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHY
GASTALDI, J
JOURDAN, C
GRANGE, G
BAUER, CL
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1988, 109 (02): : 403 - 411
[36] X-RAY TOPOGRAPHY WITH SYNCHROTRON RADIATION
ALESHKOOZHEVSKIJ, OP
PANCHENKO, VE
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1987, 261 (1-2): : 240 - 245
[37] A STATION FOR SYNCHROTRON X-RAY TOPOGRAPHY
LIDER, VV
ALESHKOOZHEVSKIJ, OP
SHILIN, YN
KOVALCHUK, MV
LITVINOV, YM
MAZURENKO, SN
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1989, 282 (2-3): : 632 - 633
[38] DETECTORS FOR SYNCHROTRON X-RAY TOPOGRAPHY
KOCH, A
MOY, JP
MORSE, J
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1993, 26 (4A) : A19 - A21
[39] In situ synchrotron x-ray photon beam characterization
Kyele, Nicholas R.
van Silfhout, Roelof G.
Manolopoulos, Spyros
Nikitenko, S.
[J]. JOURNAL OF APPLIED PHYSICS, 2007, 101 (06)
[40] In situ synchrotron x-ray photon beam characterization
Kyele, Nicholas R.
Van Silfhout, Roelof G.
Manolopoulos, Spyros
Nikitenko, S.
[J]. Journal of Applied Physics, 2007, 101 (06):

← 1 2 3 4 5 →