X-RAY TOPOGRAPHY USING SYNCHROTRON-RADIATION

被引：2
|
作者：
WIETESKA, K
机构：
来源：
ACTA PHYSICA POLONICA A | 1994年 / 86卷 / 04期
关键词：
D O I：
10.12693/APhysPolA.86.545
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
X-ray diffraction topography is a widely used method to study crystal lattice defects by visualization. The properties of synchrotron radiation relevant to topography methods extend the possibilities of investigations. These properties are the following: a high intensity, a broad spectral range, a natural collimation, a linear polarization in the horizontal plane, and a pulsed time structure. The application of synchrotron radiation to X-ray topographic studies is described and some recent examples of experiments are presented.
引用
收藏
页码：545 / 552
页数：8
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