user

In situ synchrotron x-ray photon beam characterization

被引：0
|
作者：
Kyele, Nicholas R. [1 ]
Van Silfhout, Roelof G. [1 ]
Manolopoulos, Spyros [2 ]
Nikitenko, S. [3 ]
机构：
[1] School of Electrical and Electronic Engineering, University of Manchester, P.O. Box 88, Manchester M60 1QD, United Kingdom
[2] CCLRC, Rutherford Appleton Laboratory, Chilton, Didcot OX11 0QX, United Kingdom
[3] DUBBLE, ESRF, rue Jules Horowitz, 38000 Grenoble, France
来源：
Journal of Applied Physics | 2007年 / 101卷 / 06期
关键词：
22;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Journal article (JA)
引用
收藏
相关论文
共 50 条
  • [1] In situ synchrotron x-ray photon beam characterization
    Kyele, Nicholas R.
    van Silfhout, Roelof G.
    Manolopoulos, Spyros
    Nikitenko, S.
    [J]. JOURNAL OF APPLIED PHYSICS, 2007, 101 (06)
  • [2] In situ synchrotron x-ray characterization of ZnO atomic layer deposition
    Fong, D. D.
    Eastman, J. A.
    Kim, S. K.
    Fister, T. T.
    Highland, M. J.
    Baldo, P. M.
    Fuoss, P. H.
    [J]. APPLIED PHYSICS LETTERS, 2010, 97 (19)
  • [3] An electron beam melting system for in-situ synchrotron X-ray monitoring
    Escano, Luis I.
    Clark, Samuel J.
    Chuang, Andrew C.
    Yuan, Jiandong
    Guo, Qilin
    Qu, Minglei
    Dong, William
    Zhang, Xinhang
    Huang, Junye
    Fezzaa, Kamel
    Kenesei, Peter
    Walker, Brandon J.
    Sun, Tao
    Eliceiri, Kevin W.
    Chen, Lianyi
    [J]. ADDITIVE MANUFACTURING LETTERS, 2022, 3
  • [4] Characterization of SiC using synchrotron white beam X-ray topography
    Dudley, M
    Huang, XR
    [J]. SILICON CARBIDE AND RELATED MATERIALS - 1999 PTS, 1 & 2, 2000, 338-3 : 431 - 436
  • [5] In situ Synchrotron X-ray Thermodiffraction of Boranes
    Yot, Pascal G.
    Miele, Philippe
    Demirci, Umit B.
    [J]. CRYSTALS, 2016, 6 (02):
  • [6] WHITE BEAM SYNCHROTRON X-RAY INTERFEROMETRY
    HART, M
    SAUVAGE, M
    SIDDONS, DP
    [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1980, 36 (NOV): : 947 - 951
  • [7] X-RAY TOPOGRAPHY WITH SYNCHROTRON RADIATION AT THE PHOTON FACTORY
    ANDO, M
    SUZUKI, S
    KAWATA, H
    OGAWA, T
    NAKAJIMA, T
    KOHRA, K
    [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1984, 40 : C329 - C329
  • [8] A portable molecular beam epitaxy system for in situ x-ray investigations at synchrotron beamlines
    Slobodskyy, T.
    Schroth, P.
    Grigoriev, D.
    Minkevich, A. A.
    Hu, D. Z.
    Schaadt, D. M.
    Baumbach, T.
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2012, 83 (10):
  • [9] In situ high-speed synchrotron X-ray beam profiling and position monitoring
    van Silfhout, R. G.
    Manolopoulos, S.
    Kyele, N. R.
    Decanniere, K.
    [J]. SENSORS AND ACTUATORS A-PHYSICAL, 2007, 133 (01) : 82 - 87
  • [10] Composition characterization of combinatorial materials by scanning X-ray fluorescence microscopy using microfocused synchrotron X-ray beam
    Vogt, S
    Chu, YS
    Tkachuk, A
    Ilinski, P
    Walko, DA
    Tsui, F
    [J]. APPLIED SURFACE SCIENCE, 2004, 223 (1-3) : 214 - 219
12345