In situ synchrotron x-ray photon beam characterization

被引：0
|
作者：
Kyele, Nicholas R. [1 ]
Van Silfhout, Roelof G. [1 ]
Manolopoulos, Spyros [2 ]
Nikitenko, S. [3 ]
机构：
[1] School of Electrical and Electronic Engineering, University of Manchester, P.O. Box 88, Manchester M60 1QD, United Kingdom
[2] CCLRC, Rutherford Appleton Laboratory, Chilton, Didcot OX11 0QX, United Kingdom
[3] DUBBLE, ESRF, rue Jules Horowitz, 38000 Grenoble, France
来源：
Journal of Applied Physics | 2007年 / 101卷 / 06期
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