Production Test Considerations for Mixed-signal IC with Background Calibration

被引：2

作者：

Yagi, Takuya ^{[1
]}

Kobayashia, Haruo ^{[1
]}

Tan, Yohei ^{[1
]}

Ito, Satoshi ^{[1
]}

Uemori, Satoshi ^{[1
]}

Takai, Nobukazu ^{[1
]}

Yamaguchi, Takahiro J. ^{[1
]}

机构：

[1] Gunma Univ, Grad Sch Engn, Dept Elect Engn, Kiryu, Gunma 3768515, Japan

来源：

IEEJ TRANSACTIONS ON ELECTRICAL AND ELECTRONIC ENGINEERING | 2010年 / 5卷 / 06期

关键词：

mixed-signal IC Test; BIST; ATE; background calibration; digitally assisted analog technology;

D O I：

10.1002/tee.20584

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper proposes an improved method of background calibration that reduces the production testing lime of mixed-signal ICs. Production testing nine typically consists of 'calibration convergence time' and 'functional testing time' following calibration convergence The method of reducing calibration convergence time that is proposed here does not require an extra ADC operation for functional testing after calibration convergence, and can be implemented with a little additional on-chip test-support circuitry when testing is performed by an automatic test equipment (ATE) We discuss the application of this method to background calibration of pipelined ADCs, and present simulation results that demonstrate its effectiveness in reducing testing time (C) 2010 Institute of Electrical Engineers of Japan Published by John Wiley & Sons. Inc

引用

页码：627 / 631

页数：5

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