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Systematic error of the nose-to-nose sampling-oscilloscope calibration

被引：5
|
作者：
Williams, Dylan F. [1 ]
Clement, Tracy S.
Remley, Kate A.
Hale, Tatil D.
Verbeyst, Frans
机构：
[1] Natl Inst Stand & Technol, Boulder, CO 80305 USA
[2] NMDG Engn, B-2880 Bornem, Belgium
[3] Vrije Univ Brussel VIB, Fac Ingn, Vakgrp ELEC, B-1050 Brussels, Belgium
来源：
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 2007年 / 55卷 / 09期
关键词：
calibration; electrooptic sampling; impedance mismatch; mismatch correction; nose-to-nose calibration; sampling oscilloscope; swept-sine calibration; UNCERTAINTY; DISTORTION;
D O I：
10.1109/TMTT.2007.904333
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We use traceable swept-sine and electrooptic-sampling-system-based sampling-oscilloscope calibrations to measure the systematic error of the nose-to-nose calibration, and compare the results to simulations. Our results show that the errors in the nose-to-nose calibration are small at low frequencies, but significant at high frequencies.
引用
收藏
页码：1951 / 1957
页数：7
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