Machine Learning for IC Design and Technology Co-Optimization in Extreme Scaling

被引：0
|
作者：
Pan, David Z. [1 ]
机构：
[1] Univ Texas Austin, Austin, TX 78712 USA
来源：
2018 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN, AUTOMATION AND TEST (VLSI-DAT) | 2018年
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中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
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页数：1
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