Automatic Data Repair Overwrite Pulse for 3D-TLC NAND Flash Memories with 38x Data-retention Lifetime Extension

被引：7
|
作者：
Mizoguchi, Kyoji [1 ]
Maeda, Kyosuke [1 ]
Takeuchi, Ken [1 ]
机构：
[1] Chuo Univ, Dept Elect Elect & Commun Engn, Tokyo, Japan
来源：
2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) | 2019年
关键词：
3D-TLC NAND flash; SSD; data-retention; data repair;
D O I：
10.1109/irps.2019.8720420
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper proposes Automatic Data Repair Overwrite Pulse (ADROP) to improve the reliability of 3D-TLC NAND flash. When ECC cannot correct errors, ADROP overwrites data including errors to failed memory cells and thus adaptively injects electrons to memory cells that were lost during the data-retention by the lateral charge migration and the vertical charge de-trap. As a result, the data-retention lifetime increases by 38.3-times. ADROP is composed of V-TH Shift Recovery Pulse (VSRP) and Data Repair Pulse (DRP) that are implemented in the SSD controller without circuit area overhead.
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页数：5
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