High precision 2-D angle measurement using fringe analysis techniques

被引:1
|
作者
Ge, ZT [1 ]
Saito, T [1 ]
Matsuda, S [1 ]
Takeda, M [1 ]
机构
[1] Fuji Photo Opt Co Ltd, Omiya, Saitama 3308624, Japan
来源
关键词
2-D angle measurement; interferometry; fringe analysis; Fourier transform method; phase shift method; least square fitting;
D O I
10.1117/12.453643
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In this paper, a novel angle measurement method using the fringe analysis techniques is proposed. In this method, a 2-D surface profile including a tilt is obtained by fringe analysis, and the tilt in the 2-D surface profile is determined by fitting the obtained surface profile with a plane. From the fitted plane, 2-D angles can be easily obtained. Simulations using the Fourier transform and phase-shift methods are performed, and the results are compared with each other. Simulations show that 2-D angle measurement using the fringe analysis techniques can achieve simultaneously a wide measurement range and high precision.
引用
收藏
页码:448 / 457
页数:10
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