A Stepwise Dimension Reduction Approach to Evolutionary Design of Relative Large Combinational Logic Circuits

被引:0
|
作者
Li, Zhifang [1 ]
Luo, Wenjian [1 ]
Wang, Xufa [1 ]
机构
[1] Univ Sci & Technol China, Dept Comp Sci & Technol, Nat Inspired Computat & Applicat Lab, Hefei 230027, Anhui, Peoples R China
关键词
Evolvable Hardware; Evolutionary Algorithm; Combinational Logic Circuits;
D O I
暂无
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
In this paper, a stepwise dimension reduction (SDR) approach to evolutionary design of relatively large combinational logic circuits is proposed. The proposed method divides the whole circuit into several layers. As for a circuit with one output, the number of input combinations is expected to be reduced layer-by-layer. The current layer's outputs are the next layer's inputs. All layers are evolved separately one after another, and assembled to form a final solution. The experimental results of SDR on parities, multipliers and circuits taken from MCNC library are comparable with those of GDD. Especially, the 19-parity circuit can be evolved successfully.
引用
收藏
页码:47 / 58
页数:12
相关论文
共 50 条
  • [42] Evolutionary design and optimization of combinational digital circuits with respect to transistor count
    SLowik, A.
    BiaLko, M.
    Bulletin of the Polish Academy of Sciences: Technical Sciences, 2006, 54 (04) : 437 - 442
  • [43] Comparing different serial and parallel heuristics to design combinational logic circuits
    Coello, CAC
    Alba, E
    Luque, G
    Aguirre, AH
    2003 NASA/DOD CONFERENCE ON EVOLVABLE HARDWARE, 2003, : 3 - 12
  • [44] REALISTIC APPROACH TO DETECTION TEST SET GENERATION FOR COMBINATIONAL LOGIC CIRCUITS
    BENNETTS, RG
    COMPUTER JOURNAL, 1972, 15 (03): : 238 - +
  • [45] Design and optimization of combinational digital circuits using modified evolutionary algorithm
    Slowik, A
    Bialko, M
    ARTIFICIAL INTELLIGENCE AND SOFT COMPUTING - ICAISC 2004, 2004, 3070 : 468 - 473
  • [46] REDUCTION OF LIST OF SINGLE FAULTS IN DESIGN OF TESTS FOR COMBINATIONAL CIRCUITS
    VASILENKO, MN
    SAPOZHNIKOV, VV
    SAPOZHNIKOV, VV
    AUTOMATION AND REMOTE CONTROL, 1974, 35 (08) : 1332 - 1337
  • [47] On testing of interconnect open defects in combinational logic circuits with stems of large fanout
    Reddy, SM
    Pomeranz, I
    Tang, HX
    Kajihara, S
    Kinoshita, K
    INTERNATIONAL TEST CONFERENCE 2002, PROCEEDINGS, 2002, : 83 - 89
  • [48] Evolutionary algorithms and their use in the design of sequential logic circuits
    Ali B.
    Almaini A.E.A.
    Kalganova T.
    Genetic Programming and Evolvable Machines, 2004, 5 (01) : 11 - 29
  • [49] Design of Ternary Logic Combinational Circuits Based on Quantum Dot Gate FETs
    Karmakar, Supriya
    Chandy, John A.
    Jain, Faquir C.
    IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2013, 21 (05) : 793 - 806
  • [50] Comparative study of serial and parallel heuristics used to design combinational logic circuits
    Alba, Enrique
    Luque, Gabriel
    Coello Coello, Carlos A.
    Hernandez Lunat, Erika
    OPTIMIZATION METHODS & SOFTWARE, 2007, 22 (03): : 485 - 509