A DAC Mismatch Calibration Technique for Multibit ΣΔ Modulators

被引：0
|
作者：
Ali, Shafqat [1 ]
Tanner, Steve [1 ]
Farine, Pierre Andre [1 ]
机构：
[1] Ecole Polytech Fed Lausanne, CH-1015 Lausanne, Switzerland
来源：
2013 IEEE 11TH INTERNATIONAL NEW CIRCUITS AND SYSTEMS CONFERENCE (NEWCAS) | 2013年
关键词：
background DAC calibration; sigma-delta; modulator;
D O I：
暂无
中图分类号：
TP301 [理论、方法];
学科分类号：
081202 ;
摘要：
A technique for the calibration of DAC (digital to analog converter) mismatch errors in multi-bit Sigma Delta modulators (SDM) is presented. It consists of two parts: the first is a measurement technique to obtain the relative mismatch of each feedback DAC element. The second is a correction method applied to the modulator output to correct for the effect of DAC non linearity. The proposed technique works completely in the background. The paper presents a detailed analysis of the possible error sources affecting the accuracy of the calibration, as well as a comparison with other state of the art techniques. The technique is applied to a 3rd order SDM showing almost ideal characteristics after calibration.
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页数：4
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