Functional Probes for Scanning Probe Microscopy

被引：0
|
作者：
Akiyama, K. [1 ]
Eguchi, T. [1 ]
Hamada, M. [1 ]
An, T. [1 ]
Fujikawa, Y. [1 ]
Hasegawa, Y. [1 ]
Sakurai, T. [1 ]
机构：
[1] Tohoku Univ, Inst Mat Res, Aoba Ku, 2-1-1 Katahira, Sendai, Miyagi 9808577, Japan
来源：
FRONTIERS IN MATERIALS RESEARCH | 2008年 / 10卷
关键词：
D O I：
暂无
中图分类号：
X [环境科学、安全科学];
学科分类号：
08 ; 0830 ;
摘要：
Functional probes for scanning probe microscopy (SPM) were fabricated with focused ion beam (FIB) method. Metal-tip cantilevers were fabricated for Kelvin probe force microscopy (KFM) and glass-coated tungsten tips were fabricated for scanning tunneling microscopy under irradiation of synchrotron-radiation light (SR-STM). Here we report the fabrication process and the characterization of those functional probes.
引用
收藏
页码：305 / +
页数：2
相关论文
共 50 条
  • [41] Scanning probe Microscopy for Nanotechnology
    Bykov, VA
    SEVENTH INTERNATIONAL SYMPOSIUM ON LASER METROLOGY APPLIED TO SCIENCE, INDUSTRY, AND EVERYDAY LIFE, PTS 1 AND 2, 2002, 4900 : 225 - 239
  • [42] ULTRAFAST SCANNING PROBE MICROSCOPY
    WEISS, S
    OGLETREE, DF
    BOTKIN, D
    SALMERON, M
    CHEMLA, DS
    APPLIED PHYSICS LETTERS, 1993, 63 (18) : 2567 - 2569
  • [43] Scanning Probe Microscopy - Foreword
    不详
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2000, 39 (6B): : IV - IV
  • [44] Scanning probe microscopy of polymers
    Journal of the American Chemical Society, 1999, 121 (23):
  • [45] Scanning Probe Microscopy FOREWORD
    Nakajima, Ken
    Sumitomo, Koji
    Nakayama, Tomonobu
    Fukui, Ken-ichi
    Kageshima, Masami
    Kawai, Shigeki
    Komeda, Tadahiro
    Takahashi, Takuji
    Uchihashi, Takayuki
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2021, 60 (SE)
  • [46] SCANNING PROBE MICROSCOPY Foreword
    Rosenwaks, Yossi
    ISRAEL JOURNAL OF CHEMISTRY, 2008, 48 (02) : I - III
  • [47] Scanning probe microscopy in microbiology
    Firtel, M
    Beveridge, TJ
    MICRON, 1995, 26 (04) : 347 - 362
  • [48] Scanning Probe Microscopy FOREWORD
    Takahashi, Takuji
    Fukui, Ken-ichi
    Kageshima, Masami
    Komeda, Tadahiro
    Nakajima, Ken
    Nakayama, Tomonobu
    Sumitomo, Koji
    Uchihashi, Takayuki
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2017, 56 (08)
  • [49] SCANNING PROBE MICROSCOPY AND NANOTECHNOLOGY
    LOMAS, M
    ROBERTS, CJ
    DAVIES, MC
    JACKSON, DE
    TENDLER, SJB
    CHEMISTRY & INDUSTRY, 1993, (18) : 707 - 711
  • [50] Scanning probe microscopy of graphene
    Deshpande, Aparna
    LeRoy, Brian J.
    PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2012, 44 (04): : 743 - 759
12345