ULTRAFAST SCANNING PROBE MICROSCOPY

被引：102
|
作者：
WEISS, S [1 ]
OGLETREE, DF [1 ]
BOTKIN, D [1 ]
SALMERON, M [1 ]
CHEMLA, DS [1 ]
机构：
[1] LAWRENCE BERKELEY LAB,DIV MAT SCI,BERKELEY,CA 94720
来源：
APPLIED PHYSICS LETTERS | 1993年 / 63卷 / 18期
关键词：
D O I：
10.1063/1.110435
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We have measured the response of the tunneling gap of a scanning tunneling microscope to excitation by a subpicosecond electrical pulse. Combining ultrashort laser pulses techniques with scanning tunneling microscopy (STM), we have obtained simultaneous 2-ps time resolution and 50-angstrom spatial resolution. This is a 9 orders of magnitude improvement in the time resolution currently attainable with STM. The potential of this powerful technique for studying ultrafast dynamical phenomena on surfaces with atomic resolution and mesoscopic electronic device physics is discussed.
引用
收藏
页码：2567 / 2569
页数：3
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