Efficient Post-Silicon Validation of Network-on-Chip using Wireless Links

被引:5
|
作者
Rout, Sidhartha Sankar [1 ]
Basu, Kanad [2 ]
Deb, Sujay [1 ]
机构
[1] Indraprastha Inst Informat Technol Delhi, New Delhi, India
[2] NYU, Brooklyn, NY USA
关键词
TRACE-SIGNAL SELECTION; RESTORATION;
D O I
10.1109/VLSID.2019.00082
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Modern complex interconnect systems are augmented with new features to serve the increasing number of on-chip processing elements (PE). To achieve the desired performance, power and reliability in the contemporary designs; Network-on-Chips (NoC) are reinforced with additional hardware and pipeline stages. Wireless hubs are supplemented on top of the baseline wired NoC for efficient intra-chip long distance communications. With the increasing complexity of the network, it is extremely difficult to ensure the functional correctness of the interconnect module at the pre-silicon verification stage. Hence, a robust post-silicon validation mechanism for NoCs has to be devised to guarantee the error-free functioning of the system. This paper exploits the capabilities of the wireless hubs present in wireless NoC (WNoC) to establish a novel post-silicon validation model for communication networks. The proposed method facilitates a better observability of the system in case of transient packet faults like misroute and packet-drop without any additional overhead in term of trace buffer size and trace bandwidth requirement. An overall 30% improvement in fault detection and path reconstruction is observed in comparison to the wired network using this wireless scheme. The wireless transceivers constructively use the existing network to transport the traces till the external debug analyzer, thus eliminating the need of additional trace bus while elevating the speed of trace communication.
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页码:371 / 376
页数:6
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