VIPIC IC - Design and Test Aspects of the 3D Pixel Chip

被引:0
|
作者
Deptuch, G. W. [1 ]
Trimpl, M. [1 ]
Yarema, R. [1 ]
Siddons, D. P. [2 ]
Carini, G. [2 ]
Grybos, P. [3 ]
Szczygiel, R. [3 ]
Kachel, M. [3 ]
Kmon, P. [3 ]
Maj, P. [3 ]
机构
[1] Fermilab Natl Accelerator Lab, ASIC Dev Grp, Dept Elect Engn, Particle Phys Div, POB 500, Batavia, IL 60510 USA
[2] Brookhaven Natl Lab, Upton, NY 11973 USA
[3] AGH Univ Sci & Technol, Dept Measurement & Instrumentat, PL-30059 Krakow, Poland
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report on the design of the VIPIC IC (Vertically Integrated Pixel Imaging Chip) designed for X-ray Photon Correlation Spectroscopy (XPCS) experiments by FNAL in collaboration with AGH-UST. The VIPIC chip is a prototype matrix with 64 x 64 pixels with 80 mu m x 80 mu m pixel size and consists of two layers: analog and digital. The single analog pixel cell consists of a charge sensitive amplifier, a shaper, a single current discriminator and trim DACs. The simulated gain is 52 mu V/e(-), the noise ENC < 150 e(-) rms (with C-det = 100 fF) and the peaking time t(p) < 250 ns. The power consumption is 25 mu W/pixel in the analog part. The digital layer of the VIPIC integrated circuit is divided into 16 readout groups of pixels read out in parallel via separate serial ports with nominal frequency of the 100 MHz clock using the LVDS standard. The readout within each group is zero-suppressed. The sparsification scheme (addresses of hit pixels only) allows a dead-time free readout.
引用
收藏
页码:1540 / 1543
页数:4
相关论文
共 50 条
  • [1] Functional Test Pattern Generation for Maximizing Temperature in 3D IC Chip Stack
    Srinivasan, Sudarshan
    Kundu, Sandip
    [J]. 2012 13TH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN (ISQED), 2012, : 109 - 116
  • [2] Design and Fabrication of a Test Chip for 3D Integration Process Evaluation
    Song, Chongshen
    Wang, Zheyao
    Liu, Litian
    [J]. 2011 IEEE 61ST ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2011, : 1764 - 1769
  • [3] 3D IC Test Scheduling with Test Pads Considered
    Hsu, Ming-Hsuan
    Cheng, Chun-Hua
    Huang, Shih-Hsu
    [J]. 2016 5TH INTERNATIONAL SYMPOSIUM ON NEXT-GENERATION ELECTRONICS (ISNE), 2016,
  • [4] Design and test of the CMS pixel readout chip
    Barbero, M
    Bertl, W
    Dietrich, G
    Dorokhov, A
    Erdmann, W
    Gabathuler, K
    Heising, S
    Hörmann, C
    Horisberger, R
    Kästli, HC
    Kotlinski, D
    Meier, B
    Weber, R
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2004, 517 (1-3): : 349 - 359
  • [5] 3D Contactless communication for IC design
    Canegallo, Roberto
    Ciccarelli, Luca
    Natali, Federico
    Fazzi, Alberto
    Guerrieri, Roberto
    Rolandi, PierLuigi
    [J]. 2008 IEEE INTERNATIONAL CONFERENCE ON INTEGRATED CIRCUIT DESIGN AND TECHNOLOGY, PROCEEDINGS, 2008, : 241 - +
  • [6] Scaling aspects of microjoints for 3D chip interconnects
    Munding, A.
    Kaiser, A.
    Benkart, P.
    Kohn, E.
    Heittmann, A.
    Huebner, H.
    Ramacher, U.
    [J]. ESSDERC 2006: PROCEEDINGS OF THE 36TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE, 2006, : 262 - +
  • [7] Design of 3D Optical Network on Chip
    Gu, Huaxi
    Xu, Jiang
    [J]. 2009 SYMPOSIUM ON PHOTONICS AND OPTOELECTRONICS (SOPO 2009), 2009, : 771 - 774
  • [8] Test beam characterization of irradiated 3D pixel sensors
    Garcia Alonso, A.
    Curras, E.
    Duarte-Campderros, J.
    Fernandez, M.
    Gomez, G.
    Gonzalez, J.
    Silva, E.
    Vila, I
    Jaramillo, R.
    Meschini, M.
    Ceccarelli, R.
    Dinardo, M.
    Gennai, S.
    Moroni, L.
    Zuolo, D.
    Demaria, N.
    Monteil, E.
    Gaioni, L.
    Messineo, A.
    Dalla Beta, G-F
    Menicino, R.
    Boscardin, M.
    Hidalgo, S.
    Merlos, A.
    Pellegrini, G.
    Quirion, D.
    Manna, M.
    [J]. JOURNAL OF INSTRUMENTATION, 2020, 15 (03):
  • [9] Routability in 3D IC Design: Monolithic 3D vs. Skybridge 3D CMOS
    Shi, Jiajun
    Li, Mingyu
    Khasanvis, Santosh
    Rahman, Mostafizur
    Moritz, Csaba Andras
    [J]. PROCEEDINGS OF THE 2016 IEEE/ACM INTERNATIONAL SYMPOSIUM ON NANOSCALE ARCHITECTURES (NANOARCH), 2016, : 145 - 150
  • [10] A TSV Alignment Design for Multilayer 3D IC
    Zhao, Wei
    Hou, Ligang
    Peng, Xiaohong
    Wang, Jinhui
    Fu, Jingyan
    Yang, Yang
    [J]. PROCEEDINGS OF 2015 IEEE 11TH INTERNATIONAL CONFERENCE ON ASIC (ASICON), 2015,