Growth of InAs/InAlAs Core-Shell Nanowires on Si and Transistor Application

被引:4
|
作者
Tomioka, Katsuhiro [1 ]
Tanaka, Tomotaka [1 ]
Fukui, Takashi [1 ]
机构
[1] Hokkaido Univ, Grad Sch Informat Sci & Technol, Sapporo, Hokkaido 0608628, Japan
来源
关键词
WRAP GATE TRANSISTORS;
D O I
10.1149/1.3633021
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
We review the fabrication process for a surrounding-gate transistor using InAs and InAs/InAlAs core-multishell nanowires (NWs) heterogeneously integrated on Si. Selective-area metal-organic vapor-phase epitaxy (SA-MOVPE) that allows for the position-controlled growth of vertical InAs NWs on (111) oriented surfaces using lithographic techniques was used to grow these nanowires. The nanometer-scale growth enabled for the integration of III-V NWs on Si regardless of apparent lattice mismatches. A non-planar vertical transistor architecture, which is a vertical surrounding-gate structure, was demonstrated on Si substrate. This demonstrated device should have broad applications for use in high-electron mobility transistors with a functionality not made possible using conventional Si-CMOS techniques.
引用
收藏
页码:61 / 69
页数:9
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