A 36Gb/s Adaptive Baud-Rate CDR with CTLE and 1-Tap DFE in 28nm CMOS

被引：0
|
作者：
Yoo, Danny [1 ]
Bagherbeik, Mohammad [1 ]
Rahman, Wahid [1 ]
Sheikholeslami, Ali [1 ]
Tamura, Hirotaka [2 ]
Shibasaki, Takayuki [2 ]
机构：
[1] Univ Toronto, Toronto, ON, Canada
[2] Fujitsu Labs, Kawasaki, Kanagawa, Japan
来源：
2019 IEEE INTERNATIONAL SOLID-STATE CIRCUITS CONFERENCE (ISSCC) | 2019年 / 62卷
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：126 / +
页数：3
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