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- [21] The impact of interfacial Si contamination on GaN-on-GaN regrowth for high power vertical devicesAPPLIED PHYSICS LETTERS, 2021, 118 (22)Fu, Kai论文数: 0 引用数: 0 h-index: 0机构: Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USA Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USAFu, Houqiang论文数: 0 引用数: 0 h-index: 0机构: Iowa State Univ, Dept Elect & Comp Engn, Ames, IA 50011 USA Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USADeng, Xuguang论文数: 0 引用数: 0 h-index: 0机构: Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USA Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USASu, Po-Yi论文数: 0 引用数: 0 h-index: 0机构: Arizona State Univ, Dept Phys, Tempe, AZ 85287 USA Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USALiu, Hanxiao论文数: 0 引用数: 0 h-index: 0机构: Arizona State Univ, Dept Phys, Tempe, AZ 85287 USA Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USAHatch, Kevin论文数: 0 引用数: 0 h-index: 0机构: Arizona State Univ, Dept Phys, Tempe, AZ 85287 USA Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USACheng, Chi-Yin论文数: 0 引用数: 0 h-index: 0机构: Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USA Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USAMessina, Daniel论文数: 0 引用数: 0 h-index: 0机构: Arizona State Univ, Dept Phys, Tempe, AZ 85287 USA Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USAMeidanshahi, Reza Vatan论文数: 0 引用数: 0 h-index: 0机构: Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USA Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USA论文数: 引用数: h-index:机构:Yang, Chen论文数: 0 引用数: 0 h-index: 0机构: Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USA Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USA论文数: 引用数: h-index:机构:Montes, Jossue论文数: 0 引用数: 0 h-index: 0机构: Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USA Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USAZhou, Jingan论文数: 0 引用数: 0 h-index: 0机构: Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USA Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USAQi, Xin论文数: 0 引用数: 0 h-index: 0机构: Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USA Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USAGoodnick, Stephen M.论文数: 0 引用数: 0 h-index: 0机构: Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USA Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USAPonce, Fernando A.论文数: 0 引用数: 0 h-index: 0机构: Arizona State Univ, Dept Phys, Tempe, AZ 85287 USA Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USASmith, David J.论文数: 0 引用数: 0 h-index: 0机构: Arizona State Univ, Dept Phys, Tempe, AZ 85287 USA Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USANemanich, Robert论文数: 0 引用数: 0 h-index: 0机构: Arizona State Univ, Dept Phys, Tempe, AZ 85287 USA Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USAZhao, Yuji论文数: 0 引用数: 0 h-index: 0机构: Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USA Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USA
- [22] Initial leakage current paths in the vertical-type GaN-on-GaN Schottky barrier diodesAPPLIED PHYSICS LETTERS, 2017, 111 (12)Sang, Liwen论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Mat Sci, Int Ctr Mat Nanoarchitecton MANA, 1-1 Namiki, Tsukuba, Ibaraki 3050044, Japan Natl Inst Mat Sci, Amano Koide Collaborat Res Lab, 1-1 Namiki, Tsukuba, Ibaraki 3050044, Japan Natl Inst Mat Sci, Int Ctr Mat Nanoarchitecton MANA, 1-1 Namiki, Tsukuba, Ibaraki 3050044, JapanRen, Bing论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Mat Sci, Int Ctr Mat Nanoarchitecton MANA, 1-1 Namiki, Tsukuba, Ibaraki 3050044, Japan Natl Inst Mat Sci, Int Ctr Mat Nanoarchitecton MANA, 1-1 Namiki, Tsukuba, Ibaraki 3050044, JapanSumiya, Masatomo论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Mat Sci, Wide Bandgap Mat Grp, 1-1 Namiki, Tsukuba, Ibaraki 3050044, Japan Natl Inst Mat Sci, Int Ctr Mat Nanoarchitecton MANA, 1-1 Namiki, Tsukuba, Ibaraki 3050044, JapanLiao, Meiyong论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Mat Sci, Wide Bandgap Mat Grp, 1-1 Namiki, Tsukuba, Ibaraki 3050044, Japan Natl Inst Mat Sci, Int Ctr Mat Nanoarchitecton MANA, 1-1 Namiki, Tsukuba, Ibaraki 3050044, JapanKoide, Yasuo论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Mat Sci, Amano Koide Collaborat Res Lab, 1-1 Namiki, Tsukuba, Ibaraki 3050044, Japan Nagoya Univ, Inst Mat & Syst Sustainabil, Furo Cho C3-1, Nagoya, Aichi 4648601, Japan Natl Inst Mat Sci, Int Ctr Mat Nanoarchitecton MANA, 1-1 Namiki, Tsukuba, Ibaraki 3050044, JapanTanaka, Atsushi论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Mat Sci, Amano Koide Collaborat Res Lab, 1-1 Namiki, Tsukuba, Ibaraki 3050044, Japan Nagoya Univ, Inst Mat & Syst Sustainabil, Furo Cho C3-1, Nagoya, Aichi 4648601, Japan Natl Inst Mat Sci, Int Ctr Mat Nanoarchitecton MANA, 1-1 Namiki, Tsukuba, Ibaraki 3050044, JapanCho, Yujin论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Mat Sci, Int Ctr Mat Nanoarchitecton MANA, 1-1 Namiki, Tsukuba, Ibaraki 3050044, Japan Natl Inst Mat Sci, Int Ctr Mat Nanoarchitecton MANA, 1-1 Namiki, Tsukuba, Ibaraki 3050044, JapanHarada, Yoshitomo论文数: 0 引用数: 0 h-index: 0机构: Hosei Univ, Koganei, Tokyo 1848584, Japan Natl Inst Mat Sci, Int Ctr Mat Nanoarchitecton MANA, 1-1 Namiki, Tsukuba, Ibaraki 3050044, JapanNabatame, Toshihide论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Mat Sci, Int Ctr Mat Nanoarchitecton MANA, 1-1 Namiki, Tsukuba, Ibaraki 3050044, Japan Natl Inst Mat Sci, Amano Koide Collaborat Res Lab, 1-1 Namiki, Tsukuba, Ibaraki 3050044, Japan Natl Inst Mat Sci, Int Ctr Mat Nanoarchitecton MANA, 1-1 Namiki, Tsukuba, Ibaraki 3050044, JapanSekiguchi, Takashi论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Mat Sci, Int Ctr Mat Nanoarchitecton MANA, 1-1 Namiki, Tsukuba, Ibaraki 3050044, Japan Natl Inst Mat Sci, Int Ctr Mat Nanoarchitecton MANA, 1-1 Namiki, Tsukuba, Ibaraki 3050044, JapanUsami, Shigeyoshi论文数: 0 引用数: 0 h-index: 0机构: Nagoya Univ, Inst Mat & Syst Sustainabil, Furo Cho C3-1, Nagoya, Aichi 4648601, Japan Natl Inst Mat Sci, Int Ctr Mat Nanoarchitecton MANA, 1-1 Namiki, Tsukuba, Ibaraki 3050044, JapanHonda, Yoshio论文数: 0 引用数: 0 h-index: 0机构: Nagoya Univ, Inst Mat & Syst Sustainabil, Furo Cho C3-1, Nagoya, Aichi 4648601, Japan Natl Inst Mat Sci, Int Ctr Mat Nanoarchitecton MANA, 1-1 Namiki, Tsukuba, Ibaraki 3050044, JapanAmano, Hiroshi论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Mat Sci, Amano Koide Collaborat Res Lab, 1-1 Namiki, Tsukuba, Ibaraki 3050044, Japan Nagoya Univ, Inst Mat & Syst Sustainabil, Furo Cho C3-1, Nagoya, Aichi 4648601, Japan Natl Inst Mat Sci, Int Ctr Mat Nanoarchitecton MANA, 1-1 Namiki, Tsukuba, Ibaraki 3050044, Japan
- [23] Effects of X-ray Irradiation on Vertical GaN-on-GaN Schottky Barrier Diode Biased on the Applied Voltage2020 IEEE INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA), 2020,Li, Xiao-Xi论文数: 0 引用数: 0 h-index: 0机构: Fudan Univ, State Key Lab ASIC & Syst, Shanghai Inst Intelligent Elect & Syst, Sch Microelect, Shanghai 200433, Peoples R China Fudan Univ, State Key Lab ASIC & Syst, Shanghai Inst Intelligent Elect & Syst, Sch Microelect, Shanghai 200433, Peoples R ChinaChen, Jin-Xin论文数: 0 引用数: 0 h-index: 0机构: Fudan Univ, State Key Lab ASIC & Syst, Shanghai Inst Intelligent Elect & Syst, Sch Microelect, Shanghai 200433, Peoples R China Fudan Univ, State Key Lab ASIC & Syst, Shanghai Inst Intelligent Elect & Syst, Sch Microelect, Shanghai 200433, Peoples R ChinaHuang, Wei论文数: 0 引用数: 0 h-index: 0机构: Fudan Univ, State Key Lab ASIC & Syst, Shanghai Inst Intelligent Elect & Syst, Sch Microelect, Shanghai 200433, Peoples R China Fudan Univ, State Key Lab ASIC & Syst, Shanghai Inst Intelligent Elect & Syst, Sch Microelect, Shanghai 200433, Peoples R ChinaJi, Zhigang论文数: 0 引用数: 0 h-index: 0机构: Shanghai Jiao Tong Univ, Natl Key Lab Sci & Technol Micro Nano Fabricat, Shanghai 200240, Peoples R China Fudan Univ, State Key Lab ASIC & Syst, Shanghai Inst Intelligent Elect & Syst, Sch Microelect, Shanghai 200433, Peoples R ChinaFeng, Zhi-Hong论文数: 0 引用数: 0 h-index: 0机构: Hebei Semicond Res Inst, Sci & Technol ASIC Lab, Shijiazhuang 050051, Hebei, Peoples R China Fudan Univ, State Key Lab ASIC & Syst, Shanghai Inst Intelligent Elect & Syst, Sch Microelect, Shanghai 200433, Peoples R ChinaWu, Su-Zhen论文数: 0 引用数: 0 h-index: 0机构: Wuxi Microelect Sci & Res Ctr, Adv Proc & Integrat Lab, Wuxi 214072, Jiangsu, Peoples R China Fudan Univ, State Key Lab ASIC & Syst, Shanghai Inst Intelligent Elect & Syst, Sch Microelect, Shanghai 200433, Peoples R ChinaXiao, Zhi-Qiang论文数: 0 引用数: 0 h-index: 0机构: Fudan Univ, State Key Lab ASIC & Syst, Shanghai Inst Intelligent Elect & Syst, Sch Microelect, Shanghai 200433, Peoples R China Wuxi Microelect Sci & Res Ctr, Adv Proc & Integrat Lab, Wuxi 214072, Jiangsu, Peoples R China Fudan Univ, State Key Lab ASIC & Syst, Shanghai Inst Intelligent Elect & Syst, Sch Microelect, Shanghai 200433, Peoples R ChinaLu, Hong-Liang论文数: 0 引用数: 0 h-index: 0机构: Fudan Univ, State Key Lab ASIC & Syst, Shanghai Inst Intelligent Elect & Syst, Sch Microelect, Shanghai 200433, Peoples R China Fudan Univ, State Key Lab ASIC & Syst, Shanghai Inst Intelligent Elect & Syst, Sch Microelect, Shanghai 200433, Peoples R China
- [24] Metal organic chemical vapour deposition regrown large area GaN-on-GaN current aperture vertical electron transistors with high current capabilityELECTRONICS LETTERS, 2021, 57 (03) : 145 - 147Doering, Philipp论文数: 0 引用数: 0 h-index: 0机构: Albert Ludwigs Univ, Dept Power Elect, D-79108 Freiburg, Germany Albert Ludwigs Univ, Dept Power Elect, D-79108 Freiburg, GermanyDriad, Rachid论文数: 0 引用数: 0 h-index: 0机构: Fraunhofer Inst Appl Solid State Phys IAF, D-79108 Freiburg, Germany Albert Ludwigs Univ, Dept Power Elect, D-79108 Freiburg, GermanyReiner, Richard论文数: 0 引用数: 0 h-index: 0机构: Fraunhofer Inst Appl Solid State Phys IAF, D-79108 Freiburg, Germany Albert Ludwigs Univ, Dept Power Elect, D-79108 Freiburg, GermanyWaltereit, Patrick论文数: 0 引用数: 0 h-index: 0机构: Fraunhofer Inst Appl Solid State Phys IAF, D-79108 Freiburg, Germany Albert Ludwigs Univ, Dept Power Elect, D-79108 Freiburg, GermanyMikulla, Michael论文数: 0 引用数: 0 h-index: 0机构: Fraunhofer Inst Appl Solid State Phys IAF, D-79108 Freiburg, Germany Albert Ludwigs Univ, Dept Power Elect, D-79108 Freiburg, GermanyAmbacher, Oliver论文数: 0 引用数: 0 h-index: 0机构: Albert Ludwigs Univ, Dept Power Elect, D-79108 Freiburg, Germany Fraunhofer Inst Appl Solid State Phys IAF, D-79108 Freiburg, Germany Albert Ludwigs Univ, Dept Power Elect, D-79108 Freiburg, Germany
- [25] Change of high-voltage conduction mechanism in vertical GaN-on-GaN Schottky diodes at elevated temperaturesAPPLIED PHYSICS EXPRESS, 2020, 13 (07)Sandupatla, Abhinay论文数: 0 引用数: 0 h-index: 0机构: Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, SingaporeArulkumaran, Subramaniam论文数: 0 引用数: 0 h-index: 0机构: Nanyang Technol Univ, Temasek Labs NTU, Res Techno Plaza,50 Nanyang Dr, Singapore 637553, Singapore Nagoya Univ, Ctr Integrated Res Future Elect CIRFE, Inst Mat & Syst Sustainabil IMaSS, Nagoya, Aichi 4648603, Japan Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, SingaporeNg, Geok Ing论文数: 0 引用数: 0 h-index: 0机构: Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore Nanyang Technol Univ, Temasek Labs NTU, Res Techno Plaza,50 Nanyang Dr, Singapore 637553, Singapore Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, SingaporeRanjan, Kumud论文数: 0 引用数: 0 h-index: 0机构: Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore Nanyang Technol Univ, Temasek Labs NTU, Res Techno Plaza,50 Nanyang Dr, Singapore 637553, Singapore Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, SingaporeDeki, Manato论文数: 0 引用数: 0 h-index: 0机构: Nagoya Univ, Ctr Integrated Res Future Elect CIRFE, Inst Mat & Syst Sustainabil IMaSS, Nagoya, Aichi 4648603, Japan Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, SingaporeNitta, Shugo论文数: 0 引用数: 0 h-index: 0机构: Nagoya Univ, Ctr Integrated Res Future Elect CIRFE, Inst Mat & Syst Sustainabil IMaSS, Nagoya, Aichi 4648603, Japan Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, SingaporeHonda, Yoshio论文数: 0 引用数: 0 h-index: 0机构: Nagoya Univ, Ctr Integrated Res Future Elect CIRFE, Inst Mat & Syst Sustainabil IMaSS, Nagoya, Aichi 4648603, Japan Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, SingaporeAmano, Hiroshi论文数: 0 引用数: 0 h-index: 0机构: Nagoya Univ, Ctr Integrated Res Future Elect CIRFE, Inst Mat & Syst Sustainabil IMaSS, Nagoya, Aichi 4648603, Japan Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore
- [26] High voltage and high current density vertical GaN power diodesELECTRONICS LETTERS, 2016, 52 (13) : 1170 - 1171Armstrong, A. M.论文数: 0 引用数: 0 h-index: 0机构: Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USA Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USAAllerman, A. A.论文数: 0 引用数: 0 h-index: 0机构: Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USA Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USAFischer, A. J.论文数: 0 引用数: 0 h-index: 0机构: Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USA Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USAKing, M. P.论文数: 0 引用数: 0 h-index: 0机构: Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USA Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USAvan Heukelom, M. S.论文数: 0 引用数: 0 h-index: 0机构: Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USA Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USAMoseley, M. W.论文数: 0 引用数: 0 h-index: 0机构: Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USA Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USAKaplar, R. J.论文数: 0 引用数: 0 h-index: 0机构: Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USA Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USAWierer, J. J.论文数: 0 引用数: 0 h-index: 0机构: Lehigh Univ, Elect & Comp Engn, Bethlehem, PA 18015 USA Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USACrawford, M. H.论文数: 0 引用数: 0 h-index: 0机构: Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USA Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USADickerson, J. R.论文数: 0 引用数: 0 h-index: 0机构: Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USA Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USA
- [27] Structural breakdown in high power GaN-on-GaN p-n diode devices stressed to failureJOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2020, 38 (06):论文数: 引用数: h-index:机构:Fu, Kai论文数: 0 引用数: 0 h-index: 0机构: Arizona State Univ, Sch Elect Energy & Comp Engn, Tempe, AZ 85287 USA Arizona State Univ, Sch Engn Matter Transport & Energy, Tempe, AZ 85287 USAFu, Houqiang论文数: 0 引用数: 0 h-index: 0机构: Arizona State Univ, Sch Elect Energy & Comp Engn, Tempe, AZ 85287 USA Arizona State Univ, Sch Engn Matter Transport & Energy, Tempe, AZ 85287 USAZhao, Yuji论文数: 0 引用数: 0 h-index: 0机构: Arizona State Univ, Sch Elect Energy & Comp Engn, Tempe, AZ 85287 USA Arizona State Univ, Sch Engn Matter Transport & Energy, Tempe, AZ 85287 USASmith, David J.论文数: 0 引用数: 0 h-index: 0机构: Arizona State Univ, Dept Phys, Tempe, AZ 85287 USA Arizona State Univ, Sch Engn Matter Transport & Energy, Tempe, AZ 85287 USA
- [28] On-Wafer Investigation of Avalanche Robustness in 1.3 kV GaN-on-GaN P-N Diode Under Unclamped Inductive Switching Stress2021 IEEE 8TH WORKSHOP ON WIDE BANDGAP POWER DEVICES AND APPLICATIONS (WIPDA), 2021, : 40 - 43Shankar, Bhawani论文数: 0 引用数: 0 h-index: 0机构: Stanford Univ, WBG Lab, Elect Engn, Stanford, CA 94305 USA Stanford Univ, WBG Lab, Elect Engn, Stanford, CA 94305 USAZeng, Ke论文数: 0 引用数: 0 h-index: 0机构: Stanford Univ, WBG Lab, Elect Engn, Stanford, CA 94305 USA Stanford Univ, WBG Lab, Elect Engn, Stanford, CA 94305 USAGunning, Brendan论文数: 0 引用数: 0 h-index: 0机构: Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USA Stanford Univ, WBG Lab, Elect Engn, Stanford, CA 94305 USA论文数: 引用数: h-index:机构:Martinez, Rafael Perez论文数: 0 引用数: 0 h-index: 0机构: Stanford Univ, WBG Lab, Elect Engn, Stanford, CA 94305 USA Stanford Univ, WBG Lab, Elect Engn, Stanford, CA 94305 USAMeng, Chuanzhe论文数: 0 引用数: 0 h-index: 0机构: Stanford Univ, WBG Lab, Elect Engn, Stanford, CA 94305 USA Stanford Univ, WBG Lab, Elect Engn, Stanford, CA 94305 USAZhou, Xin Yu论文数: 0 引用数: 0 h-index: 0机构: Stanford Univ, WBG Lab, Elect Engn, Stanford, CA 94305 USA Stanford Univ, WBG Lab, Elect Engn, Stanford, CA 94305 USAFlicker, Jack论文数: 0 引用数: 0 h-index: 0机构: Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USA Stanford Univ, WBG Lab, Elect Engn, Stanford, CA 94305 USABinder, Andrew论文数: 0 引用数: 0 h-index: 0机构: Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USA Stanford Univ, WBG Lab, Elect Engn, Stanford, CA 94305 USADickerson, Jeramy Ray论文数: 0 引用数: 0 h-index: 0机构: Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USA Stanford Univ, WBG Lab, Elect Engn, Stanford, CA 94305 USAKaplar, Robert论文数: 0 引用数: 0 h-index: 0机构: Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USA Stanford Univ, WBG Lab, Elect Engn, Stanford, CA 94305 USAChowdhury, Srabanti论文数: 0 引用数: 0 h-index: 0机构: Stanford Univ, WBG Lab, Elect Engn, Stanford, CA 94305 USA Stanford Univ, WBG Lab, Elect Engn, Stanford, CA 94305 USA
- [29] High Breakdown Voltage and High Current Injection Vertical GaN-on-GaN p-n Diodes With Extremely Low On-Resistance Fabricated on Ammonothermally Grown Bulk GaN SubstratesIEEE TRANSACTIONS ON ELECTRON DEVICES, 2022, 69 (11) : 6255 - 6259Taube, Andrzej论文数: 0 引用数: 0 h-index: 0机构: Lukasiewicz Res Network Inst Microelect & Photon, PL-02668 Warsaw, Poland Lukasiewicz Res Network Inst Microelect & Photon, PL-02668 Warsaw, Poland论文数: 引用数: h-index:机构:Tarenko, Jaroslaw论文数: 0 引用数: 0 h-index: 0机构: Lukasiewicz Res Network Inst Microelect & Photon, PL-02668 Warsaw, Poland Warsaw Univ Technol, Inst Microelect & Optoelect, PL-00662 Warsaw, Poland Lukasiewicz Res Network Inst Microelect & Photon, PL-02668 Warsaw, PolandSadowski, Oskar论文数: 0 引用数: 0 h-index: 0机构: Lukasiewicz Res Network Inst Microelect & Photon, PL-02668 Warsaw, Poland Warsaw Univ Technol, Inst Microelect & Optoelect, PL-00662 Warsaw, Poland Lukasiewicz Res Network Inst Microelect & Photon, PL-02668 Warsaw, PolandEkielski, Marek论文数: 0 引用数: 0 h-index: 0机构: Lukasiewicz Res Network Inst Microelect & Photon, PL-02668 Warsaw, Poland Lukasiewicz Res Network Inst Microelect & Photon, PL-02668 Warsaw, PolandSzerling, Anna论文数: 0 引用数: 0 h-index: 0机构: Lukasiewicz Res Network Inst Microelect & Photon, PL-02668 Warsaw, Poland Lukasiewicz Res Network Inst Microelect & Photon, PL-02668 Warsaw, PolandPrystawko, Pawel论文数: 0 引用数: 0 h-index: 0机构: Polish Acad Sci, Inst High Pressure Phys, PL-01142 Warsaw, Poland Lukasiewicz Res Network Inst Microelect & Photon, PL-02668 Warsaw, PolandBockowski, Michal论文数: 0 引用数: 0 h-index: 0机构: Polish Acad Sci, Inst High Pressure Phys, PL-01142 Warsaw, Poland Lukasiewicz Res Network Inst Microelect & Photon, PL-02668 Warsaw, PolandGrzegory, Izabella论文数: 0 引用数: 0 h-index: 0机构: Polish Acad Sci, Inst High Pressure Phys, PL-01142 Warsaw, Poland Lukasiewicz Res Network Inst Microelect & Photon, PL-02668 Warsaw, Poland
- [30] High voltage, high current GaN-on-GaN p-n diodes with partially compensated edge terminationAPPLIED PHYSICS LETTERS, 2018, 113 (02)Wang, Jingshan论文数: 0 引用数: 0 h-index: 0机构: Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USA Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USACao, Lina论文数: 0 引用数: 0 h-index: 0机构: Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USA Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USAXie, Jinqiao论文数: 0 引用数: 0 h-index: 0机构: Qorvo Inc, 500 West Renner Rd, Richardson, TX 75080 USA Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USABeam, Edward论文数: 0 引用数: 0 h-index: 0机构: Qorvo Inc, 500 West Renner Rd, Richardson, TX 75080 USA Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USAMcCarthy, Robert论文数: 0 引用数: 0 h-index: 0机构: MicroLink Devices, 6457 West Howard St, Niles, IL 60714 USA Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USAYoutsey, Chris论文数: 0 引用数: 0 h-index: 0机构: MicroLink Devices, 6457 West Howard St, Niles, IL 60714 USA Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USAFay, Patrick论文数: 0 引用数: 0 h-index: 0机构: Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USA Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USA