Investigation of conductivity modulation in vertical GaN-on-GaN PiN diode under high current density

被引:3
|
作者
Li, Yanjun [1 ]
Yang, Shu [1 ]
Ji, Fengwei [2 ]
Tang, Xi [2 ]
Sheng, Kuang [1 ]
机构
[1] Zhejiang Univ, Coll Elect Engn, Hangzhou 310027, Peoples R China
[2] Anhui Univ, Inst Phys Sci & Informat Technol, Hefei 230601, Peoples R China
基金
中国国家自然科学基金;
关键词
P-N DIODES; MOBILITY MODEL; SCHOTTKY DIODE; SURGE CURRENT; BAND-GAP; VOLTAGE; TEMPERATURE; TECHNOLOGY; ACTIVATION; LIFETIME;
D O I
10.1063/5.0140725
中图分类号
O59 [应用物理学];
学科分类号
摘要
This work studies the conductivity modulation in the vertical GaN-on-GaN PiN diode (PND) under high current density and its impact on surge current capability. Thanks to the direct-bandgap of GaN, the junction temperature at different current densities could be characterized by both photo-luminescence and electro-luminescence measurements. The junction temperature rises from 300 K at similar to 0.1 kA/cm(2) to 620 K at similar to 9.0 kA/cm(2) with emission peaks shifted from 3.38 to 3.21 eV. Meanwhile, the electro-thermal behavior of the vertical GaN PND shows that the hole concentration in p-GaN is increased due to self-heating, leading to enhanced conductivity modulation and negative temperature-dependence of ON-resistance, which is desirable for surge current capability. The heat accumulation in GaN under surge current condition could be suppressed by the enhanced conductivity modulation. The surge energy density can reach similar to 200 J/cm(2) in the GaN PND, showing the potential of vertical GaN-on-GaN power devices in the high electro-thermal-ruggedness application.
引用
收藏
页数:6
相关论文
共 50 条
  • [41] Leakage current suppression and breakdown voltage enhancement in GaN-on-GaN vertical Schottky barrier diodes enabled by oxidized platinum as Schottky contact metal
    Shi, Zhongyu
    Xiang, Xuediang
    Zhang, Haochen
    He, Qiming
    Jian, Guangzhong
    Zhou, Kai
    Zhou, Xuanze
    Xing, Chong
    Xu, Guangwei
    Long, Shibing
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2022, 37 (06)
  • [42] HVPE growth of bulk GaN with high conductivity for vertical devices
    Xia, Songyuan
    Zhang, Yumin
    Wang, Jianfeng
    Chen, Jihu
    Xu, Ke
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2021, 36 (01)
  • [43] Instability of On-Resistance in Vertical GaN PIN Diodes Under High-Temperature and Voltage Stress
    Wang, Dawei
    Mudiyanselage, Dinusha Herath
    He, Ziyi
    Da, Bingcheng
    Fu, Houqiang
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2024, 71 (03) : 1681 - 1686
  • [44] 15.1 W/mm Power Density GaN-on-GaN HEMT With High-Gradient Stepped-C Doped Buffer
    Li, Shiming
    Wu, Mei
    Yang, Ling
    Yang, Bowen
    Sun, Haolun
    Zhang, Meng
    Hou, Bin
    Lu, Hao
    Ma, Xiaohua
    Hao, Yue
    IEEE ELECTRON DEVICE LETTERS, 2025, 46 (03) : 365 - 368
  • [45] Low Leakage and High Forward Current Density Quasi-Vertical GaN Schottky Barrier Diode With Post-Mesa Nitridation
    Kang, Xuanwu
    Sun, Yue
    Zheng, Yingkui
    Wei, Ke
    Wu, Hao
    Zhao, Yuanyuan
    Liu, Xinyu
    Zhang, Guoqi
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2021, 68 (03) : 1369 - 1373
  • [46] Pseudo-vertical GaN-on-Sapphire PiN Diode: Process Optimizations and Electrical Properties
    Lyu, Zihao
    Billoue, Jerome
    Nadaud, Kevin
    Ladroue, Julien
    Paoli, Quentin
    Yvon, Arnaud
    Frayssinet, Eric
    Cordier, Yvon
    Alquier, Daniel
    2024 19TH EUROPEAN MICROWAVE INTEGRATED CIRCUITS CONFERENCE, EUMIC 2024, 2024, : 383 - 386
  • [47] Electron beam-induced current investigation of GaN Schottky diode
    A. Matoussi
    T. Boufaden
    S. Guermazi
    Y. Mlik
    B. El Jani
    A. Toureille
    Journal of Electronic Materials, 2005, 34 : 1059 - 1064
  • [48] Electron beam-induced current investigation of GaN Schottky diode
    Matoussi, A
    Boufaden, T
    Guermazi, S
    Mlik, Y
    El Jani, B
    Toureille, A
    JOURNAL OF ELECTRONIC MATERIALS, 2005, 34 (07) : 1059 - 1064
  • [49] Scaling Study on High-Current Density Low-Dispersion GaN Vertical FinFETs
    Jeong, Seungbin
    Lee, Kwangjae
    Chun, Jaeyi
    Soman, Rohith
    Chowdhury, Srabanti
    IEEE ELECTRON DEVICE LETTERS, 2023, 44 (05) : 841 - 844
  • [50] Over 10 kA/cm2 inductive current sustaining capability demonstrated in GaN-on-GaN pn junction with high ruggedness
    Bai, Yu
    Xu, Weizong
    Zhou, Feng
    Wang, Yiwang
    Guo, Lijian
    Ren, Fangfang
    Zhou, Dong
    Chen, Dunjun
    Zhang, Rong
    Zheng, Youdou
    Lu, Hai
    MICRO AND NANOSTRUCTURES, 2022, 170