Penetrating Imaging of Concealed Features in Banknotes with Near-Field Scanning Microwave Microscopy

被引:0
|
作者
Wang, Meidi [1 ]
Liu, Haoyun [1 ]
Huang, Pan [1 ]
Wu, Zhe [1 ]
机构
[1] Univ Elect Sci & Technol China, Sch Phys, Chengdu 611731, Peoples R China
来源
ELECTRONICS | 2024年 / 13卷 / 23期
关键词
near-field microwave; penetrating scanning; concealed features; banknote anti-counterfeiting; ATOMIC-FORCE MICROSCOPY; PERMITTIVITY; RESOLUTION;
D O I
10.3390/electronics13234729
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Traditional anti-counterfeiting techniques and methods are inadequate to meet the modern, sophisticated anti-counterfeiting requirement in banknotes. We applied our homemade near-field scanning microwave microscopy (NSMM) for penetrating imaging of concealed anti-counterfeiting features in banknotes. This NSMM imaged and characterized several vital concealed anti-counterfeiting features in the banknotes, including the dynamic color-shifting security threads, color-changing denomination numbers, magnetically embedded security threads, and white watermarks. At the same time, with the obstruction of red ink, near-field microwaves still penetrated the medium layer to characterize the detailed information of the security threads successfully. Additionally, the cavity perturbation method was used to obtain the effective permittivity of 3.65 and 3.62 for the windowing security thread and middle-embedded security thread. The thickness of the watermark was calculated to be about 3.3 mu m with the calibrated fit method.
引用
收藏
页数:14
相关论文
共 50 条
  • [41] Imaging microwave electric fields using a near-field scanning microwave microscope
    Dutta, SK
    Vlahacos, CP
    Steinhauer, DE
    Thanawalla, AS
    Feenstra, BJ
    Wellstood, FC
    Anlage, SM
    Newman, HS
    APPLIED PHYSICS LETTERS, 1999, 74 (01) : 156 - 158
  • [42] NEAR-FIELD SCANNING OPTICAL MICROSCOPY
    MORRISON, GH
    ANALYTICAL CHEMISTRY, 1989, 61 (19) : A1075 - A1075
  • [43] SCANNING NEAR-FIELD OPTICAL MICROSCOPY AND SCANNING THERMAL MICROSCOPY
    PYLKKI, RJ
    MOYER, PJ
    WEST, PE
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (6B): : 3785 - 3790
  • [44] Scanning near-field cathodoluminescence microscopy
    Troyon, M
    Pastre, D
    Jouart, JP
    Beaudoin, JL
    ELECTRON MICROSCOPY 1998, VOL 1: GENERAL INTEREST AND INSTRUMENTATION, 1998, : 453 - 454
  • [45] Scanning near-field optical microscopy and scanning thermal microscopy
    Pylkki, Russell J., 1600, JJAP, Minato-ku, Japan (33):
  • [46] Near-field scanning - Optical microscopy
    Shiku, H
    Dunn, RC
    ANALYTICAL CHEMISTRY, 1999, 71 (01) : 23A - 29A
  • [47] SCANNING NEAR-FIELD ACOUSTIC MICROSCOPY
    GUNTHER, P
    FISCHER, U
    DRANSFELD, K
    APPLIED PHYSICS B-PHOTOPHYSICS AND LASER CHEMISTRY, 1989, 48 (01): : 89 - 92
  • [48] SCANNING NEAR-FIELD OPTICAL MICROSCOPY
    HEINZELMANN, H
    POHL, DW
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1994, 59 (02): : 89 - 101
  • [49] Scanning near-field cathodoluminescence microscopy
    Troyon, M
    Pastré, D
    Jouart, JP
    Beaudoin, JL
    ULTRAMICROSCOPY, 1998, 75 (01) : 15 - 21
  • [50] Scanning near-field infrared microscopy
    Tom Vincent
    Nature Reviews Physics, 2021, 3 : 537 - 537