Near-field scanning - Optical microscopy

被引：21

作者：

Shiku, H ^{[1
]}

Dunn, RC ^{[1
]}

机构：

[1] Univ Kansas, Dept Chem, Lawrence, KS 66045 USA

来源：

关键词：

D O I：

10.1021/ac9900984

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：23A / 29A

页数：7

共 50 条

[1] NEAR-FIELD SCANNING OPTICAL MICROSCOPY
MORRISON, GH
ANALYTICAL CHEMISTRY, 1989, 61 (19) : A1075 - A1075
[2] SCANNING NEAR-FIELD OPTICAL MICROSCOPY
HEINZELMANN, H
POHL, DW
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1994, 59 (02): : 89 - 101
[3] Near-field scanning optical microscopy
Buratto, SK
CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE, 1996, 1 (04): : 485 - 492
[4] Near-field scanning optical microscopy
Dunn, RC
CHEMICAL REVIEWS, 1999, 99 (10) : 2891 - +
[5] Scanning near-field optical microscopy
Kirstein, S
CURRENT OPINION IN COLLOID & INTERFACE SCIENCE, 1999, 4 (04) : 256 - 264
[6] Scanning near-field optical microscopy
Fokas, CS
NACHRICHTEN AUS CHEMIE TECHNIK UND LABORATORIUM, 1999, 47 (06): : 648 - +
[7] SCANNING NEAR-FIELD OPTICAL MICROSCOPY AND SCANNING THERMAL MICROSCOPY
PYLKKI, RJ
MOYER, PJ
WEST, PE
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (6B): : 3785 - 3790
[8] Scanning near-field optical microscopy and scanning thermal microscopy
Pylkki, Russell J., 1600, JJAP, Minato-ku, Japan (33):
[9] Detection of optical field by near-field scanning optical microscopy
Xu, TJ
Xu, JY
Wang, J
Pan, D
Sun, LQ
Tian, Q
ADVANCED OPTICAL STORAGE TECHNOLOGY, 2002, 4930 : 195 - 198
[10] Femtosecond near-field scanning optical microscopy
Nechay, BA
Siegner, U
Achermann, M
Morier-Genaud, F
Schertel, A
Keller, U
JOURNAL OF MICROSCOPY-OXFORD, 1999, 194 : 329 - 334