Penetrating Imaging of Concealed Features in Banknotes with Near-Field Scanning Microwave Microscopy

被引:0
|
作者
Wang, Meidi [1 ]
Liu, Haoyun [1 ]
Huang, Pan [1 ]
Wu, Zhe [1 ]
机构
[1] Univ Elect Sci & Technol China, Sch Phys, Chengdu 611731, Peoples R China
来源
ELECTRONICS | 2024年 / 13卷 / 23期
关键词
near-field microwave; penetrating scanning; concealed features; banknote anti-counterfeiting; ATOMIC-FORCE MICROSCOPY; PERMITTIVITY; RESOLUTION;
D O I
10.3390/electronics13234729
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Traditional anti-counterfeiting techniques and methods are inadequate to meet the modern, sophisticated anti-counterfeiting requirement in banknotes. We applied our homemade near-field scanning microwave microscopy (NSMM) for penetrating imaging of concealed anti-counterfeiting features in banknotes. This NSMM imaged and characterized several vital concealed anti-counterfeiting features in the banknotes, including the dynamic color-shifting security threads, color-changing denomination numbers, magnetically embedded security threads, and white watermarks. At the same time, with the obstruction of red ink, near-field microwaves still penetrated the medium layer to characterize the detailed information of the security threads successfully. Additionally, the cavity perturbation method was used to obtain the effective permittivity of 3.65 and 3.62 for the windowing security thread and middle-embedded security thread. The thickness of the watermark was calculated to be about 3.3 mu m with the calibrated fit method.
引用
收藏
页数:14
相关论文
共 50 条
  • [31] Near-field scanning optical microscopy imaging of multimode interference
    Campillo, AL
    Madsen, CK
    Hsu, JWP
    OPTICS LETTERS, 2003, 28 (13) : 1111 - 1113
  • [32] Near-Field Microwave Imaging Based on Planar Aperture Scanning
    Amineh, Reza K.
    Ravan, Maryam
    Trehan, Aastha
    Nikolova, Natalia K.
    2010 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST (MTT), 2010, : 760 - 763
  • [33] Imaging of magnetic excitations in nanostructures with near-field microwave microscopy
    Berweger, Samuel
    Tyrell-Ead, Robert
    Chang, Houchen
    Wu, Mingzhong
    Zhu, Na
    Tang, Hong X.
    Nembach, Hans
    Stupic, T. Karl
    Russek, Stephen
    Wallis, T. Mitch
    Kabos, Pavel
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2022, 546
  • [34] Near-Field Microwave Microscopy: Subsurface Imaging for In Situ Characterization
    Tselev, Alexander
    IEEE MICROWAVE MAGAZINE, 2020, 21 (10) : 72 - 86
  • [35] Method of increasing spatial resolution of the scanning near-field microwave microscopy
    Kantor, R
    Shvets, IV
    JOURNAL OF APPLIED PHYSICS, 2003, 93 (09) : 4979 - 4985
  • [36] Time-Domain Reflectometry for Near-Field Scanning Microwave Microscopy
    Farina, Marco
    Di Donato, Andrea
    Mencarelli, Davide
    Venanzoni, Giuseppe
    Morini, Antonio
    Pietrangelo, Tiziana
    2015 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS), 2015,
  • [37] Disentangling topographic contributions to near-field scanning microwave microscopy images
    Coakley, K. J.
    Berweger, S.
    Wallis, T. M.
    Kabos, P.
    ULTRAMICROSCOPY, 2019, 197 : 53 - 64
  • [38] Gallium nitride nanowire probe for near-field scanning microwave microscopy
    Weber, J. C.
    Blanchard, P. T.
    Sanders, A. W.
    Imtiaz, A.
    Wallis, T. M.
    Coakley, K. J.
    Bertness, K. A.
    Kabos, P.
    Sanford, N. A.
    Bright, V. M.
    APPLIED PHYSICS LETTERS, 2014, 104 (02)
  • [39] Near-field scanning microwave microscopy for detection of subsurface biological anomalies
    Wu, X
    Ramahi, OM
    IEEE ANTENNAS AND PROPAGATION SOCIETY SYMPOSIUM, VOLS 1-4 2004, DIGEST, 2004, : 2444 - 2447
  • [40] Dual mode near-field scanning optical microscopy for near-field imaging of surface plasmon polariton
    Kihm, H. W.
    Lee, K. G.
    Kim, D. S.
    Ahn, K. J.
    OPTICS COMMUNICATIONS, 2009, 282 (12) : 2442 - 2445