AUGER ELECTRON EMISSION UNDER ION-BEAM SHADOWING CONDITIONS.

被引:0
|
作者
Kudo, Hiroshi [1 ]
Murakami, Kouichi [1 ]
Takita, Koki [1 ]
Masuda, Kohzoh [1 ]
Shima, Kunihiro [1 ]
Itoh, Hisayoshi [1 ]
Ipposhi, Takashi [1 ]
Seki, Seiji [1 ]
机构
[1] Univ of Tsukuba, Inst of Applied, Physics, Tsukuba, Jpn, Univ of Tsukuba, Inst of Applied Physics, Tsukuba, Jpn
关键词
D O I
暂无
中图分类号
学科分类号
摘要
11
引用
收藏
页码:1440 / 1444
相关论文
共 50 条
  • [31] COMBINATION OF A FOCUSED ION-BEAM SYSTEM AND A SCANNING ELECTRON-MICROSCOPE FOR INSITU OBSERVATION OF ION-BEAM EFFECTS
    VIJGEN, L
    VONWELY, EJM
    ULTRAMICROSCOPY, 1989, 31 (04) : 484 - 484
  • [32] Helium ion beam induced electron emission from insulating silicon nitride films under charging conditions
    Petrov, Yu. V.
    Anikeva, A. E.
    Vyvenko, O. F.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2018, 425 : 11 - 17
  • [33] INVESTIGATION OF SPUTTERING AND KINETIC SECONDARY-ION ELECTRON-EMISSION OF COMPOSITE-MATERIALS UNDER THE INFLUENCE OF AN ION-BEAM OF MEDIUM-ENERGY
    LUBAN, RB
    NEGODAEV, MA
    BAGULYA, AV
    VACUUM, 1993, 44 (09) : 893 - 896
  • [34] ELECTRON AND ION-BEAM SPECTROSCOPY FOR SURFACE-ANALYSIS
    PANTANO, CG
    AMERICAN CERAMIC SOCIETY BULLETIN, 1980, 59 (03): : 345 - 345
  • [35] APPLICATION OF ELECTRON AND ION-BEAM ANALYSIS TECHNIQUES TO MICROELECTRONICS
    KUAN, TS
    BATSON, PE
    FEENSTRA, RM
    SLAVIN, AJ
    TROMP, RM
    IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1992, 36 (02) : 183 - 207
  • [36] ELECTRON-TEMPERATURE MEASUREMENTS WITH AN ION-BEAM PROBE
    JENNINGS, WC
    GLOWIENK.JC
    REINOVSK.RE
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1973, 18 (10): : 1276 - 1276
  • [37] ION-BEAM COOLING BY RADIATION AND ELECTRON HEAT SINK
    NGUYEN, KT
    UHM, HS
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1985, 32 (05) : 2427 - 2429
  • [38] Electron-beam and ion-beam treatment of protective coatings produced by ion plating
    Yagodkin, YD
    Pastuhov, KM
    Muboyadjyan, SA
    SURFACE & COATINGS TECHNOLOGY, 1997, 93 (2-3): : 327 - 330
  • [39] ION-BEAM STEERING WITH A HIGH-INTENSITY ELECTRON-BEAM
    NGUYEN, KT
    UHM, HS
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1985, 32 (05) : 2623 - 2625
  • [40] MECHANISMS FOR FLUOROCARBON REACTIVE ION-BEAM ETCHING OF SIO2 BY SIMULTANEOUS AUGER-ELECTRON SPECTROSCOPY MEASUREMENTS
    THOMSON, DJ
    HELMS, CR
    APPLIED PHYSICS LETTERS, 1985, 46 (11) : 1103 - 1104