Optimization of test accesses with a combined BIST and external test scheme

被引：0
|
作者：
Sugihara, Makoto [1 ]
Yasuura, Hiroto [1 ]
机构：
[1] Dept. of Comp. Sci. and Commun. Eng., Grad. Sch. of Info. Sci. Elec. Eng., Kyushu University, Kasuga-shi, 816-8580, Japan
来源：
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences | 2001年 / E84-A卷 / 11期
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摘要：
10
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页码：2731 / 2738
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