Re-synthesis for testability of redundant combinational circuits

被引：0
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作者：
Evans, A.H. [1 ]
Macii, E. [1 ]
Poncino, M. [1 ]
机构：
[1] Univ of California, La Jolla, United States
来源：
Microcomputer Applications | 1998年 / 17卷 / 01期
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页码：8 / 11
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