Oxygen trap hypothesis in silicon oxide

被引：0

作者：

Kageshima, Hiroyuki ^{[1
]}

Uematsu, Masahi ^{[1
]}

Akiyama, Toru ^{[2
]}

Ito, Tomonori ^{[2
]}

机构：

[1] NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0198, Japan

[2] Department of Physics Engineering, Mie University, 1515 Kamihama, Tsu 514-8507, Japan

来源：

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2006年 / 45卷 / 10 A期

关键词：

16;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Journal article (JA)

引用

页码：7672 / 7674

共 50 条

[21] The charge transport mechanism and electron trap nature in thermal oxide on silicon
Islamov, Damir R.
Gritsenko, Vladimir A.
Perevalov, Timofey V.
Orlov, Oleg M.
Krasnikov, Gennady Ya.
APPLIED PHYSICS LETTERS, 2016, 109 (05)
[22] INTERFACE TRAP BEHAVIOR IN IRRADIATED METAL-OXIDE-SILICON STRUCTURES
JORGENSEN, C
SVENSSON, C
RYDEN, KH
JOURNAL OF APPLIED PHYSICS, 1984, 56 (04) : 1093 - 1096
[23] METHYLFOLATE-TRAP HYPOTHESIS
TISMAN, G
WU, SJG
SAFIRE, GE
RODRIGUEZ, E
LANCET, 1975, 1 (7917): : 1184 - 1184
[24] METHYLFOLATE-TRAP HYPOTHESIS
不详
LANCET, 1975, 1 (7911): : 843 - 844
[25] THE TRAP HYPOTHESIS OF VENOUS ULCERATION
FALANGA, V
EAGLSTEIN, WH
LANCET, 1993, 341 (8851): : 1006 - 1008
[26] OBSERVATION OF THRESHOLD OXIDE ELECTRIC-FIELD FOR TRAP GENERATION IN OXIDE-FILMS ON SILICON
HSU, CCH
NISHIDA, T
SAH, CT
JOURNAL OF APPLIED PHYSICS, 1988, 63 (12) : 5882 - 5884
[27] OXYGEN VACANCIES AND INTERSTITIALS IN OXIDE-FILMS ON SILICON
FOWKES, FM
HIELSCHER, FH
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1986, 133 (08) : C315 - C316
[28] Oxygen concentration dependence of silicon oxide dynamical properties
Yajima, Yuji
Shiraishi, Kenji
Endoh, Tetsuo
Kageshima, Hiroyuki
JAPANESE JOURNAL OF APPLIED PHYSICS, 2018, 57 (06)
[29] NUCLEATION AND GROWTH OF OXIDE PRECIPITATES IN SILICON IMPLANTED WITH OXYGEN
STOEMENOS, J
MARGAIL, J
THIN SOLID FILMS, 1986, 135 (01) : 115 - 127
[30] AMORPHOUS AND CRYSTALLINE OXIDE PRECIPITATES IN OXYGEN IMPLANTED SILICON
VANOMMEN, AH
KOEK, BH
VIEGERS, MPA
APPLIED PHYSICS LETTERS, 1986, 49 (11) : 628 - 630

← 1 2 3 4 5 →