A low power test pattern generation method

被引：0
|
作者：
Zhang, Guohe [1 ]
Ji, Lili [1 ]
Zhang, Linlin [1 ]
Lei, Shaochong [1 ]
Liang, Feng [1 ]
机构：
[1] School of Electronics and Information Engineering, Xi'an Jiaotong University, Xi'an 710049, China
来源：
Hsi-An Chiao Tung Ta Hsueh/Journal of Xi'an Jiaotong University | 2013年 / 47卷 / 02期
关键词：
14;
D O I：
10.7652/xjtuxb201302008
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：47 / 52
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