Automatic test pattern generation

被引：0
|
作者：
Drechsler, Rolf [1 ]
Fey, Gorschwin [1 ]
机构：
[1] Univ Bremen, Inst Comp Sci, D-28359 Bremen, Germany
来源：
FORMAL METHODS FOR HARDWARE VERIFICATION | 2006年 / 3965卷
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
The postproduction test of integrated circuits is crucial to ensure a high quality of the final product. This test is carried out by checking the correct response of the chip under predefined input stimuli - or test patterns. These patterns are calculated by algorithms for Automatic Test Pattern Generation (ATPG). The basic concepts and algorithms for ATPG are reviewed in this chapter. Then, an advanced SAT-based ATPG tool is introduced and emprically evaluated.
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页码：30 / 55
页数：26
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