Development of multichannel ellipsometry with synchronously rotating polarizer and analyzer

被引:0
|
作者
An, Ilsin [1 ,2 ]
Park, Myung-Gyu [1 ,2 ]
Bang, Kyung-Yoon [1 ,2 ]
Oh, Hye-Keun [1 ,2 ]
Kim, Hanjung [1 ,2 ]
机构
[1] Department of Physics, Hanyang University, Ansan 425-791, Korea, Republic of
[2] Department of Control and Instrumentation, Hankyong National University, Ansung 456-749, Korea, Republic of
关键词
Calibration - Data acquisition - Discrete Fourier transforms - Shafts (machine components);
D O I
10.1143/jjap.41.3978
中图分类号
学科分类号
摘要
Rotating-polarizer-and-analyzer-ellipsometry was developed with a multichannel detector. In this system, the transmission axes of the polarizer and analyzer rotated in phase using a flexible shaft for mechanical connection. With this configuration, autocalibration for the azimuths of the polarizer and analyzer was achieved. Thus, experimental error related to the calibration could be avoided and spectroscopic ellipsometry with the simplest operation principle was realized. Data acquisition time for 512-point ellipsometry spectra was 3 s over the photon energy range of 1.5 to 4.5 eV.
引用
收藏
页码:3978 / 3980
相关论文
共 50 条
  • [21] IMPROVED MEASUREMENT METHOD IN ROTATING-ANALYZER ELLIPSOMETRY
    KAWABATA, S
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1984, 1 (07): : 706 - 710
  • [22] SYSTEMATIC AND RANDOM ERRORS IN ROTATING-ANALYZER ELLIPSOMETRY
    DENIJS, JMM
    VANSILFHOUT, A
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1988, 5 (06): : 773 - 781
  • [23] POLARIZER-SURFACE-ANALYZER NULL ELLIPSOMETRY FOR FILM-SUBSTRATE SYSTEMS
    AZZAM, RMA
    ZAGHLOUL, ARM
    BASHARA, NM
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1975, 65 (12) : 1464 - 1471
  • [24] Calibration Approach for a Rotating Polarizer Analyzer Polarimeter for Retardance Measurements
    Cervantes Lozano, Francisco J.
    Parra-Escamilla, Geliztle A.
    Santiago-Hernandez, Hector G.
    Flores, Jorge L.
    Garcia-Torales, Guillermo
    Serrano-Garcia, David, I
    INFRARED REMOTE SENSING AND INSTRUMENTATION XXVIII, 2020, 11502
  • [25] IMPROVED ROTATING ANALYZER-POLARIZER TYPE OF SCANNING ELLIPSOMETER
    CHEN, LY
    FENG, XW
    SU, Y
    MA, HZ
    QIAN, YH
    THIN SOLID FILMS, 1993, 234 (1-2) : 385 - 389
  • [26] Rotating-compensator multichannel ellipsometry: Applications in process development for nanocrystalline diamond thin films
    Collins, RW
    Lee, J
    Rovira, PI
    An, IS
    IN SITU PROCESS DIAGNOSTICS AND INTELLIGENT MATERIALS PROCESSING, 1998, 502 : 23 - 34
  • [27] A single zone azimuth calibration for rotating compensator multichannel ellipsometry
    An, L
    Lee, J
    Bang, KY
    Kim, OK
    Oh, HK
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2003, 42 (5A): : 2872 - 2875
  • [28] A single zone azimuth calibration for rotating compensator multichannel ellipsometry
    An, Ilsin
    Lee, J.Jaeho
    Bang, Kyoung-Yoon
    Kim, Ok-Kyung
    Oh, Hye-Keun
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2003, 42 (5 A): : 2872 - 2875
  • [29] Fourier Demodulation Approach for a Rotating Polarizer Analyzer Polarimeter for Retardance Measurements
    Cervantes Lozano, Francisco J.
    Parra-Escamilla, Geliztle A.
    Flores, Jorge L.
    Garcia-Torales, Guillermo
    Serrano-Garcia, David, I
    OPTICAL TECHNOLOGY AND MEASUREMENT FOR INDUSTRIAL APPLICATIONS CONFERENCE 2021, 2021, 11927
  • [30] Scanning Ellipsometer Using a Fixed Phase Retarder and Rotating Polarizer and Analyzer
    Taya, S. A.
    El-Agez, T. M.
    ACTA PHYSICA POLONICA A, 2013, 123 (02) : 183 - 184