共 50 条
- [1] Features of the Formation of Ripple Structures on the Surface of Silicon under Irradiation with a Focused Gallium Ion Beam JOURNAL OF SURFACE INVESTIGATION, 2021, 15 (SUPPL 1): : S150 - S156
- [2] Features of the Formation of Ripple Structures on the Surface of Silicon under Irradiation with a Focused Gallium Ion Beam Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques, 2021, 15 : S150 - S156
- [4] On the control of the nematic orientation on the silicon surface processed by a focused gallium ion beam Technical Physics, 2010, 55 : 883 - 886
- [5] FOCUSED ION-BEAM GALLIUM IMPLANTATION INTO SILICON APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1986, 39 (03): : 183 - 190
- [7] Simulation of Material Sputtering and Gallium Implantation during Focused Ion Beam Irradiation of a Silicon Substrate Semiconductors, 2023, 57 : 58 - 64
- [9] Angular Dependences of Silicon Sputtering by Gallium Focused Ion Beam Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques, 2020, 14 : 784 - 790
- [10] Silicon oxide deposition using a gallium focused ion beam ELECTRON-BEAM, X-RAY, EUV, AND ION-BEAM SUBMICROMETER LITHOGRAPHIES FOR MANUFACTURING VI, 1996, 2723 : 46 - 53