Wavelike Periodic Structures on the Silicon Surface Initiated by Irradiation with a Focused Gallium Ion Beam

被引:1
|
作者
Bachurin, V. I. [1 ]
Smirnova, M. A. [1 ]
Lobzov, K. N. [1 ]
Lebedev, M. E. [1 ]
Mazaletsky, L. A. [1 ]
Pukhov, D. E. [1 ]
Churilov, A. B. [1 ]
机构
[1] Russian Acad Sci, Yaroslavl Branch, Valiev Inst Phys & Technol, Yaroslavl 150067, Russia
来源
JOURNAL OF SURFACE INVESTIGATION | 2024年 / 18卷 / 04期
关键词
sputtering; wavelike relief; focused ion beam; PATTERN-FORMATION; TOPOGRAPHY DEVELOPMENT; ANGULAR DEPENDENCES; RIPPLE TOPOGRAPHY;
D O I
10.1134/S1027451024700514
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
We investigate the processes of microrelief formation on a Si(100) surface under irradiation with a Ga+-ion beam with an energy of 30 keV and a fluence of D = 1.25 x 10(18)-2 x 10(19) cm(-2) at incident angles of theta = 30 degrees-85 degrees. Within the angular range of theta = 40 degrees-70 degrees, a faceted wavy relief forms on the Si surface, while at theta = 30 degrees, a sinusoidal relief develops. An experimental dependence of the periodic structure wavelength as a function of irradiation time lambda(t) similar to t (n), where n = 0.33-0.35, is obtained. The average values of relief propagation velocities and their direction relative to the incident ion direction are determined for theta = 30 degrees and 40 degrees, amounting to -5.3 +/- 0.6 and -6.3 +/- 0.6 nm s(-1), respectively. The results are discussed in detail within the framework of existing models of wavelike surface relief formation under ion bombardment.
引用
收藏
页码:822 / 833
页数:12
相关论文
共 50 条
  • [21] LINE DOSE DEPENDENCE OF SILICON AND GALLIUM-ARSENIDE REMOVAL BY A FOCUSED GALLIUM ION-BEAM
    YAMAGUCHI, H
    JOURNAL DE PHYSIQUE, 1987, 48 (C-6): : 165 - 170
  • [22] Focused ion beam irradiation for generation of skyrmionic bubble like structures
    Ahrens, Valentin
    Mendisch, Simon
    Kaiser, Waldemar
    Kiechle, Martina
    Breitkreutz-von Gamm, Stephan
    Becherer, Markus
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2021, 523
  • [23] Periodic Surface Structures Induced by a Single Laser Beam Irradiation
    Noga, Joanna
    Sobolewska, Anna
    Bartkiewicz, Stanislaw
    Virkki, Matti
    Priimagi, Arri
    MACROMOLECULAR MATERIALS AND ENGINEERING, 2017, 302 (02)
  • [24] Fabrication of MSM detector structures on silicon by focused ion beam implantation
    Teichert, J
    Bischoff, L
    Hausmann, S
    MICROELECTRONIC ENGINEERING, 1997, 35 (1-4) : 455 - 458
  • [25] Maskless Patterning of Gallium-Irradiated Superconducting Silicon Using Focused Ion Beam
    Matsumoto, Ryo
    Adachi, Shintaro
    Sadki, El Hadi S.
    Yamamoto, Sayaka
    Tanaka, Hiromi
    Takeya, Hiroyuki
    Takano, Yoshihiko
    ACS APPLIED ELECTRONIC MATERIALS, 2020, 2 (03) : 677 - 682
  • [26] Sputtering and defect production by focused gold cluster ion beam irradiation of silicon
    Dobeli, M
    Nebiker, PW
    Muhle, R
    Suter, M
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 132 (04): : 571 - 577
  • [27] Focused ion beam machining of silicon
    Hung, NP
    Fu, YQ
    Ali, MY
    JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, 2002, 127 (02) : 256 - 260
  • [28] Surface integrity and removal rate of silicon sputtered with focused ion beam
    Hung, NP
    Ali, MY
    Fu, YQ
    Ong, NS
    Tay, ML
    MACHINING SCIENCE AND TECHNOLOGY, 2001, 5 (02) : 239 - 254
  • [29] Red luminescence from a focused ion beam modified silicon surface
    Erickson, LE
    Schmuki, P
    Lockwood, DJ
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1998, 16 (06): : 3301 - 3304
  • [30] Selective etching of focused gallium ion beam implanted regions from silicon as a nanofabrication method
    Han, Zhongmei
    Vehkamaki, Marko
    Mattinen, Miika
    Salmi, Emma
    Mizohata, Kenichiro
    Leskela, Markku
    Ritala, Mikko
    NANOTECHNOLOGY, 2015, 26 (26)