Area and Energy Efficient Short-Circuit-Logic-Based STT-MRAM Crossbar Array for Binary Neural Networks

被引:4
|
作者
Wang, Chao [1 ]
Wang, Zhaohao [2 ]
Zhang, Zhongkui [2 ]
Zhang, Youguang [1 ]
Zhao, Weisheng [2 ]
机构
[1] Beihang Univ, Fert Beijing Res Inst, Sch Elect & Informat Engn, MIIT Key Lab Spintron, Beijing 100191, Peoples R China
[2] Beihang Univ, Fert Beijing Inst, MIIT Key Lab Spintron, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R China
关键词
Spin-transfer-torque magnetoresistive random-access memory; in-memory computing; binary neural network; crossbar array; IN-MEMORY;
D O I
10.1109/TCSII.2023.3317635
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Spin-transfer-torque magnetoresistive random-access memory (STT-MRAM) is a promising candidate for future memory systems, however, implementing highly parallel neuro-inspired computing with standard STT-MRAM arrays faces the power consumption challenges due to the low resistance characteristics of the magnetic tunneling junction (MTJ). In this brief, we propose a novel in-memory computing (IMC) architecture for binary neural network (BNN). The proposed design is constructed with short-circuit-logic-based 3-transistor and 2-MTJ (3T2J-S) bit-cell to implement XNOR operations and series-connected crossbar array for bit-counting operations. By further sharing the active region, the layout area of the proposed 3T2J-S bit-cell is reduced by 20% compared with the conventional STT-MRAM crossbar bit-cell. Moreover, the proposed design can optimize the write asymmetry issue of STT-MRAM, thereby reducing the voltage required for the write operation. Furthermore, the proposed 3T2J-S bit-cell has the same on/off ratio as the conventional one, and can increase the inference frequency by 10.6% due to the reduction of the bit-cell resistance.
引用
收藏
页码:1386 / 1390
页数:5
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