YIELD VALUES IN THICK-FILM RHEOLOGY

被引：0

作者：

FRAIOLI, AV ^{[1
]}

机构：

[1] PLESSEY EMD,MELVILLE,NY 11746

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中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

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引用

页码：48 / 50

页数：3

共 50 条

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