OPTIMAL ALGORITHM FOR TESTING STUCK-AT FAULTS IN RANDOM-ACCESS MEMORIES

被引：0

作者：

KNAIZUK, J

HARTMANN, CRP

机构：

[1] SUNY COLL OSWEGO,DEPT COMP SCI,OSWEGO,NY 13126

[2] SYRACUSE UNIV,SCH COMP & INFORMAT SCI,SYRACUSE,NY 13210

来源：

IEEE TRANSACTIONS ON COMPUTERS | 1977年 / 26卷 / 11期

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：1141 / 1144

页数：4

共 50 条

[21] CRYOGENIC RANDOM-ACCESS MEMORIES
SASS, AR
STEWART, WC
COSENTINO, LS
[J]. IEEE SPECTRUM, 1967, 4 (07) : 91 - +
[22] SEMICONDUCTOR RANDOM-ACCESS MEMORIES
ALTMAN, L
[J]. ELECTRONICS, 1974, 47 (12): : 108 - 110
[23] Testing static and dynamic faults in random access memories
Hamdioui, S
Al-Ars, Z
van de Goor, AJ
[J]. 20TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 2002, : 395 - 400
[24] METHODS FOR RADIATION TESTING RANDOM-ACCESS MEMORIES AND LSI CIRCUITS
NELSON, GP
KING, EE
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1977, 24 (06) : 2341 - 2346
[25] BUILT-IN SELF-TESTING OF RANDOM-ACCESS MEMORIES
FRANKLIN, M
SALUJA, KK
[J]. COMPUTER, 1990, 23 (10) : 45 - 56
[26] SEMICONDUCTOR MEMORIES . MOS RANDOM-ACCESS MEMORIES
ROOP, D
[J]. ELECTRONIC PRODUCTS MAGAZINE, 1970, 12 (10): : 96 - &
[27] March test algorithm for unlinked static reduced three-cell coupling faults in random-access memories
Cascaval, P.
Cascaval, D.
[J]. MICROELECTRONICS JOURNAL, 2019, 93
[28] OPTIMAL DETECTION OF BRIDGE FAULTS AND STUCK-AT FAULTS IN 2-LEVEL LOGIC
IOSUPOVICZ, A
[J]. IEEE TRANSACTIONS ON COMPUTERS, 1978, 27 (05) : 452 - 455
[29] Data Block Partitioning Methods to Mitigate Stuck-At Faults in Limited Endurance Memories
Zhang, Jiangwei
Kline, Donald, Jr.
Fang, Liang
Melhem, Rami
Jones, Alex K.
[J]. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2018, 26 (11) : 2358 - 2371
[30] RANDOM-ACCESS MACHINES WITH MULTIDIMENSIONAL MEMORIES
ROBSON, JM
[J]. INFORMATION PROCESSING LETTERS, 1990, 34 (05) : 265 - 266

← 1 2 3 4 5 →