CRYOGENIC RANDOM-ACCESS MEMORIES

被引：1

|

作者：

SASS, AR

STEWART, WC

COSENTINO, LS

机构：

来源：

IEEE SPECTRUM | 1967年 / 4卷 / 07期

关键词：

D O I：

10.1109/MSPEC.1967.5215859

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

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页码：91 / +

页数：1

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