OPTIMAL ALGORITHM FOR TESTING STUCK-AT FAULTS IN RANDOM-ACCESS MEMORIES

被引：0
|
作者：
KNAIZUK, J
HARTMANN, CRP
机构：
[1] SUNY COLL OSWEGO,DEPT COMP SCI,OSWEGO,NY 13126
[2] SYRACUSE UNIV,SCH COMP & INFORMAT SCI,SYRACUSE,NY 13210
来源：
IEEE TRANSACTIONS ON COMPUTERS | 1977年 / 26卷 / 11期
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
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页码：1141 / 1144
页数：4
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