DELAY FAULT-DIAGNOSIS BY CRITICAL-PATH TRACING

被引：25
|
作者：
GIRARD, P [1 ]
LANDRAULT, C [1 ]
PRAVOSSOUDOVITCH, S [1 ]
机构：
[1] UNIV MONTPELIER 2,DEPT ELECT & COMP ENGN,F-34095 MONTPELLIER 05,FRANCE
来源：
IEEE DESIGN & TEST OF COMPUTERS | 1992年 / 9卷 / 04期
关键词：
D O I：
10.1109/54.173329
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
[No abstract available]
引用
收藏
页码：27 / 32
页数：6
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