DELAY FAULT-DIAGNOSIS BY CRITICAL-PATH TRACING

被引：25

|

作者：

GIRARD, P ^{[1
]}

LANDRAULT, C ^{[1
]}

PRAVOSSOUDOVITCH, S ^{[1
]}

机构：

[1] UNIV MONTPELIER 2,DEPT ELECT & COMP ENGN,F-34095 MONTPELLIER 05,FRANCE

来源：

IEEE DESIGN & TEST OF COMPUTERS | 1992年 / 9卷 / 04期

关键词：

D O I：

10.1109/54.173329

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

[No abstract available]

引用

收藏

页码：27 / 32

页数：6

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