共 50 条
- [32] OBSERVATION OF RING-DISTRIBUTED MICRODEFECTS IN CZOCHRALSKI-GROWN SILICON-WAFERS WITH A SCANNING PHOTON MICROSCOPE AND ITS DIAGNOSTIC APPLICATION TO DEVICE PROCESSING JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1992, 31 (6A): : 1817 - 1822
- [36] Impact of grown-in point-defects on the minority carrier lifetime in Czochralski-grown silicon wafers ADVANCED MATERIALS AND CHARACTERIZATION TECHNIQUES FOR SOLAR CELLS II, 2014, 60 : 81 - 84
- [38] On the nature of large-scale defect accumulations in Czochralski-grown silicon DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS 1995, 1996, 149 : 219 - 224
- [39] Determination of thickness of thin thermal oxide layers on Czochralski-grown silicon wafers from their longitudinal optical vibrational mode JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1996, 35 (07): : 3876 - 3877