ALGORITHM FOR CRYSTAL ALIGNMENT WITH A 2-AXIS GONIOMETER

被引：1
|
作者：
MILSTEIN, JB
机构：
[1] Department of Electrical Engineering, University of Lowell, Lowell, MA 01854, One University Avenue
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1990年 / 61卷 / 10期
关键词：
D O I：
10.1063/1.1141841
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
An algorithm for determining the necessary angular corrections to bring a selected direction in a crystal into alignment using a two-axis goniometer is presented. The procedure requires the measurement of the specimen-to-film distance, the x and y (or polar) coordinates of the reflection of interest, and the recording of the values of the rotation and oscillation axis settings used to make the back-reflection photograph. A solution in closed form may then be calculated and checked for feasibility, given the physical oscillation limits of the goniometer.
引用
收藏
页码：2581 / 2584
页数：4
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